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| 型号： | IDT82V2084PFG8 |
| 厂商： | IDT, Integrated Device Technology Inc |
| 文件页数： | 52/75页 |
| 文件大小： | 0K |
| 描述： | IC LINE INTERFC UNIT 4CH 128TQFP |
| 标准包装： | 1 |
| 类型： | 线路接口装置（LIU） |
| 规程： | E1 |
| 电源电压： | 3.13 V ~ 3.47 V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 128-LQFP |
| 供应商设备封装： | 128-TQFP（14x20） |
| 包装： | 标准包装 |
| 其它名称： | 800-1864-6 |
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56
INDUSTRIAL
TEMPERATURE RANGES
QUAD CHANNEL T1/E1/J1 LONG HAUL/SHORT HAUL LINE INTERFACE UNIT
5.2.4
TEST ACCESS PORT CONTROLLER
The TAP controller is a 16-state synchronous state machine. Figure-22
shows its state diagram following the description of each state. Note that
the figure contains two main branches to access either the data or instruc-
tion registers. The value shown next to each state transition in this figure
states the value present at TMS at each rising edge of TCK. Please refer
to Table-58 for details of the state description.
Table-58 TAP Controller State Description
STATE
DESCRIPTION
Test Logic Reset
In this state, the test logic is disabled. The device is set to normal operation. During initialization, the device initializes the instruction register
with the IDCODE instruction. Regardless of the original state of the controller, the controller enters the Test-Logic-Reset state when the
TMS input is held high for at least 5 rising edges of TCK. The controller remains in this state while TMS is high. The device processor auto-
matically enters this state at power-up.
Run-Test/Idle
This is a controller state between scan operations. Once in this state, the controller remains in the state as long as TMS is held low. The
instruction register and all test data registers retain their previous state. When TMS is high and a rising edge is applied to TCK, the control-
ler moves to the Select-DR state.
Select-DR-Scan
This is a temporary controller state and the instruction does not change in this state. The test data register selected by the current instruc-
tion retains its previous state. If TMS is held low and a rising edge is applied to TCK when in this state, the controller moves into the Cap-
ture-DR state and a scan sequence for the selected test data register is initiated. If TMS is held high and a rising edge applied to TCK, the
controller moves to the Select-IR-Scan state.
Capture-DR
In this state, the Boundary Scan Register captures input pin data if the current instruction is EXTEST or SAMPLE/PRELOAD. The instruc-
tion does not change in this state. The other test data registers, which do not have parallel input, are not changed. When the TAP controller
is in this state and a rising edge is applied to TCK, the controller enters the Exit1-DR state if TMS is high or the Shift-DR state if TMS is low.
Shift-DR
In this controller state, the test data register connected between TDI and TDO as a result of the current instruction shifts data on stage
toward its serial output on each rising edge of TCK. The instruction does not change in this state. When the TAP controller is in this state
and a rising edge is applied to TCK, the controller enters the Exit1-DR state if TMS is high or remains in the Shift-DR state if TMS is low.
Exit1-DR
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-DR
state, which terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Pause-DR
state. The test data register selected by the current instruction retains its previous value and the instruction does not change during this
state.
Pause-DR
The pause state allows the test controller to temporarily halt the shifting of data through the test data register in the serial path between TDI
and TDO. For example, this state could be used to allow the tester to reload its pin memory from disk during application of a long test
sequence. The test data register selected by the current instruction retains its previous value and the instruction does not change during this
state. The controller remains in this state as long as TMS is low. When TMS goes high and a rising edge is applied to TCK, the controller
moves to the Exit2-DR state.
Exit2-DR
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-DR
state, which terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Shift-DR
state. The test data register selected by the current instruction retains its previous value and the instruction does not change during this
state.
Update-DR
The Boundary Scan Register is provided with a latched parallel output to prevent changes while data is shifted in response to the EXTEST
and SAMPLE/PRELOAD instructions. When the TAP controller is in this state and the Boundary Scan Register is selected, data is latched
into the parallel output of this register from the shift-register path on the falling edge of TCK. The data held at the latched parallel output
changes only in this state. All shift-register stages in the test data register selected by the current instruction retain their previous value and
the instruction does not change during this state.
Select-IR-Scan
This is a temporary controller state. The test data register selected by the current instruction retains its previous state. If TMS is held low
and a rising edge is applied to TCK when in this state, the controller moves into the Capture-IR state, and a scan sequence for the instruc-
tion register is initiated. If TMS is held high and a rising edge is applied to TCK, the controller moves to the Test-Logic-Reset state. The
instruction does not change during this state.
Capture-IR
In this controller state, the shift register contained in the instruction register loads a fixed value of '100' on the rising edge of TCK. This sup-
ports fault-isolation of the board-level serial test data path. Data registers selected by the current instruction retain their value and the
instruction does not change during this state. When the controller is in this state and a rising edge is applied to TCK, the controller enters
the Exit1-IR state if TMS is held high, or the Shift-IR state if TMS is held low.
Shift-IR
In this state, the shift register contained in the instruction register is connected between TDI and TDO and shifts data one stage towards its
serial output on each rising edge of TCK. The test data register selected by the current instruction retains its previous value and the instruc-
tion does not change during this state. When the controller is in this state and a rising edge is applied to TCK, the controller enters the Exit1-
IR state if TMS is held high, or remains in the Shift-IR state if TMS is held low.
Exit1-IR
This is a temporary state. While in this state, if TMS is held high, a rising edge applied to TCK causes the controller to enter the Update-IR
state, which terminates the scanning process. If TMS is held low and a rising edge is applied to TCK, the controller enters the Pause-IR
state. The test data register selected by the current instruction retains its previous value and the instruction does not change during this
state.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| IDT82V2088 | 制造商:IDT 制造商全称:Integrated Device Technology 功能描述:OCTAL CHANNEL T1/E1/J1 LONG HAUL/ SHORT HAUL LINE INTERFACE UNIT |
| IDT82V2088_08 | 制造商:IDT 制造商全称:Integrated Device Technology 功能描述:OCTAL CHANNEL T1/E1/J1 LONG HAUL/ SHORT HAUL LINE INTERFACE UNIT |
| IDT82V2088BB | 功能描述:IC LIU T1/J1/E1 8CH 208-BGA RoHS:否 类别:集成电路 (IC) >> 接口 - 驱动器，接收器，收发器 系列:- 标准包装:250 系列:- 类型:收发器 驱动器/接收器数:2/2 规程:RS232 电源电压:3 V ~ 5.5 V 安装类型:表面贴装 封装/外壳:16-TSSOP（0.173"，4.40mm 宽） 供应商设备封装:16-TSSOP 包装:带卷 (TR) |
| IDT82V2088BBG | 功能描述:IC LINE INTERFACE UNIT 208-PBGA RoHS:是 类别:集成电路 (IC) >> 接口 - 驱动器，接收器，收发器 系列:- 标准包装:250 系列:- 类型:收发器 驱动器/接收器数:2/2 规程:RS232 电源电压:3 V ~ 5.5 V 安装类型:表面贴装 封装/外壳:16-TSSOP（0.173"，4.40mm 宽） 供应商设备封装:16-TSSOP 包装:带卷 (TR) |
| IDT82V2088DR | 功能描述:IC LIU T1/J1/E1 8CH 208-TQFP RoHS:否 类别:集成电路 (IC) >> 接口 - 驱动器，接收器，收发器 系列:- 标准包装:250 系列:- 类型:收发器 驱动器/接收器数:2/2 规程:RS232 电源电压:3 V ~ 5.5 V 安装类型:表面贴装 封装/外壳:16-TSSOP（0.173"，4.40mm 宽） 供应商设备封装:16-TSSOP 包装:带卷 (TR) |
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