参数资料
| 型号： | KAD5512P-12Q72 |
| 厂商： | Intersil |
| 文件页数： | 20/36页 |
| 文件大小： | 0K |
| 描述： | IC ADC 12BIT 125MSPS SGL 72-QFN |
| 产品培训模块： | High-Speed Analog-to-Digital Converters |
| 标准包装： | 1 |
| 系列： | FemtoCharge™ |
| 位数： | 12 |
| 采样率（每秒）： | 125M |
| 数据接口： | 串行，SPI? |
| 转换器数目： | 1 |
| 功率耗散（最大）： | 235mW |
| 电压电源： | 单电源 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 72-VFQFN 裸露焊盘 |
| 供应商设备封装： | 72-QFN（10x10） |
| 包装： | 托盘 |
| 输入数目和类型： | 1 个差分，单极 |
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KAD5512P
27
FN6807.4
October 1, 2010
ADDRESS 0X74: OUTPUT_MODE_B
ADDRESS 0X75: CONFIG_STATUS
Bit 6 DLL Range
This bit sets the DLL operating range to fast (default)
or slow.
Internal clock signals are generated by a delay-locked
loop (DLL), which has a finite operating range. Table 14
shows the allowable sample rate ranges for the slow and
fast settings.
.
The output_mode_B and config_status registers are used
in conjunction to enable DDR mode and select the
frequency range of the DLL clock generator. The method
of setting these options is different from the other
registers.
The procedure for setting output_mode_B is shown in
Figure 42. Read the contents of output_mode_B and
config_status and XOR them. Then XOR this result with
the desired value for output_mode_B and write that XOR
result to the register.
Device Test
The KAD5512 can produce preset or user defined
patterns on the digital outputs to facilitate in-site testing.
A static word can be placed on the output bus, or two
different words can alternate. In the alternate mode, the
values defined as Word 1 and Word 2 (as shown in
Table 15) are set on the output bus on alternating clock
phases. The test mode is enabled asynchronously to the
sample clock, therefore several sample clock cycles may
elapse before the data is present on the output bus.
ADDRESS 0XC0: TEST_IO
Bits 7:6 User Test Mode
These bits set the test mode to static (0x00) or
alternate (0x01) mode. Other values are reserved.
The four LSBs in this register (Output Test Mode)
determine the test pattern in combination with registers
0xC2 through 0xC5. Refer to Table 17.
ADDRESS 0XC2: USER_PATT1_LSB AND
ADDRESS 0XC3: USER_PATT1_MSB
These registers define the lower and upper eight bits,
respectively, of the first user-defined test word.
ADDRESS 0XC4: USER_PATT2_LSB AND
ADDRESS 0XC5: USER_PATT2_MSB
These registers define the lower and upper eight bits,
respectively, of the second user-defined test word.
72 Pin/48 Pin Package Options
The KAD5512 is available in both 72 pin and 48 pin
packages. The 48 pin package option supports LVDS DDR
only. A reduced set of pin selectable functions are
available in the 48 pin package due to the reduced
pinout; (OUTMODE, OUTFMT, and CLKDIV pins are not
available). Table 16 shows the default state for these
functions for the 48 pin package. Note that these
functions are available through the SPI, allowing a user
to set these modes as they desire, offering the same
flexibility as the 72 pin package option. DC and AC
performance of the ADC is equivalent for both package
options.
TABLE 13. OUTPUT FORMAT CONTROL
VALUE
0x93[2:0]
OUTPUT FORMAT
000
Pin Control
001
Two’s Complement
010
Gray Code
100
Offset Binary
TABLE 14. DLL RANGES
DLL RANGE
MIN
MAX
UNIT
Slow
40
100
MSPS
Fast
80
fS MAX
MSPS
FIGURE 42. SETTING OUTPUT_MODE_B REGISTER
READ
CONFIG_STATUS
0x75
READ
OUTPUT_MODE_B
0x74
DESIRED
VALUE
WRITE TO
0x74
TABLE 15. OUTPUT TEST MODES
VALUE
0xC0[3:0]
OUTPUT TEST MODE
WORD 1
WORD 2
0000
Off
0001
Midscale
0x8000
N/A
0010
Positive Full-Scale
0xFFFF
N/A
0011
Negative Full-Scale
0x0000
N/A
0100
Checkerboard
0xAAAA
0x5555
0101
Reserved
N/A
0110
Reserved
N/A
0111
One/Zero
0xFFFF
0x0000
1000
User Pattern
user_patt1 user_patt2
TABLE 16. 48 PIN SPI - ADDRESSABLE FUNCTIONS
FUNCTION
DESCRIPTION
DEFAULT STATE
CLKDIV
Clock Divider
Divide by 1
OUTMODE
Output Driver
Mode
LVDS, 3mA (DDR)
OUTFMT
Data Coding
Two’s Complement
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相关代理商/技术参数 |
参数描述 |
|---|---|
| KAD5512P-17Q48 | 功能描述:模数转换器 - ADC 12-BIT 170MSPS SINGL ADC PROG LVDS/LVCMOS RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| KAD5512P-17Q72 | 功能描述:模数转换器 - ADC 12-BIT 170MSPS SINGL ADC PROG LVDS/LVCMOS RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| KAD5512P-21Q48 | 功能描述:模数转换器 - ADC 12-BIT 210MSPS SINGL ADC PROG LVDS/LVCMOS RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| KAD5512P-21Q72 | 功能描述:模数转换器 - ADC 12-BIT 210MSPS SINGL ADC PROG LVDS/LVCMOS RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| KAD5512P-25Q48 | 功能描述:模数转换器 - ADC 12-BIT 250MSPS SINGL PROG LVDS/LVCMOS RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
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