参数资料
型号: MA28151
厂商: Dynex Semiconductor Ltd.
英文描述: Radiation hard Programmable Communication Interface
中文描述: 辐射硬可编程通信接口
文件页数: 16/22页
文件大小: 186K
代理商: MA28151
MA28151
16/22
6. DC CHARACTERISTICS AND RATINGS
Parameter
Min
Max
Units
Supply Voltage
-0.5
7
V
Input Voltage
-0.3
V
DD
+0.3
V
Current Through Any Pin
-20
+20
mA
Operating Temperature
-55
125
°
C
Storage Temperature
-65
150
°
C
Note:
Stresses above those listed may cause permanent
damage to the device. This is a stress rating only and
functional operation of the device at these conditions, or at
any other condition above those indicated in the operations
section of this specification, is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability.
Figure 25: Absolute Maximum Ratings
Total dose radiation not
exceeding 3x10
5
Rad(SI)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
V
DD
V
IH
V
IL
V
OH
V
OL
I
IN
Supply Voltage
-
4.5
5.0
5.5
V
Input High Voltage
-
2.2
-
-
V
Input Low Voltage
-
-
-
0.8
V
Output High Voltage
I
OH
= -2mA
I
OL
= 5mA
V
DD
= 5.5V,
V
IN
= V
SS
or V
DD
V
DD
= 5.5V,
V
IN
= V
SS
or V
DD
Static, V
DD
= 5.5V
V
DD
-0.5
-
-
-
V
Output Low Voltage
-
V
SS
+0.4
±
10
V
μ
A
Input Leakage Current (Note 1)
-
-
I
OZ
Tristate Leakage Current (Note 1)
-
-
±
50
μ
A
I
DD
Power Supply Current
-
0.1
10
mA
V
DD
= 5V
±
10%, over full operating temperature range.
Mil-Std-883, method 5005, subgroups 1, 2, 3
Note 1: Guaranteed but not tested at -55
°
C
Figure 26: Electrical Characteristics
Subgroup
Definition
1
Static characteristics specified in Figure 26 at +25
°
C
2
Static characteristics specified in Figure 26 at +125
°
C
3
Static characteristics specified in Figure 26 at -55
°
C
7
Functional characteristics specified in Figure 24 at +25
°
C
8A
Functional characteristics specified in Figure 24 at +125
°
C
8B
Functional characteristics specified in Figure 24 at -55
°
C
9
Switching characteristics specified in Figure 23 at +25
°
C
10
Switching characteristics specified in Figure 23 at +125
°
C
11
Switching characteristics specified in Figure 23 at -55
°
C
Figure 27: Definition of Mil-Std-883, Method 5005 Subgroups
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