参数资料
型号: MA31753
厂商: Dynex Semiconductor Ltd.
英文描述: DMA Controller (DMAC) For An MA31750 System
中文描述: DMA控制器(DMAC)对于MA31750系统
文件页数: 29/30页
文件大小: 243K
代理商: MA31753
MA31753
29/30
RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to total dose radiation levels, each
wafer lot will be approved when all sample devices pass the
total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with MIL STD 883 test method 1019, Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
3x10
5
Rad(Si)
Transient Upset (Stored data loss)
1x10
11
Rad(Si)/sec
Transient Upset (Survivability)
>1x10
12
Rad(Si)/sec
Neutron Hardness (Function to specification)
>1x10
15
n/cm
2
Single Event Upset**
<1x10
-10
Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 24: Radiation Hardness Parameters
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