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| 型号： | MCZ33887EK |
| 厂商： | Freescale Semiconductor |
| 文件页数： | 11/37页 |
| 文件大小： | 0K |
| 描述： | IC H-BRIDGE 5V CURR FDBK 54-SOIC |
| 标准包装： | 26 |
| 类型： | 半桥 |
| 输入类型： | 非反相 |
| 输出数： | 2 |
| 导通状态电阻： | 120 毫欧 |
| 电流 - 输出 / 通道： | 5A |
| 电流 - 峰值输出： | 6.5A |
| 电源电压： | 5 V ~ 28 V |
| 工作温度： | -40°C ~ 125°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 54-SSOP（0.295"，7.50mm 宽）裸露焊盘 |
| 供应商设备封装： | 54-SOICW-EP |
| 包装： | 管件 |
| 产品目录页面： | 808 (CN2011-ZH PDF) |
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ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. DYNAMIC ELECTRICAL CHARACTERISTICS
Characteristics noted under conditions 5.0 V ≤ V+ ≤ 28 V and -40 ° C ≤ T A ≤ 125 ° C unless otherwise noted. Typical values
noted reflect the approximate parameter mean at T A = 25 ° C under nominal conditions unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
TIMING CHARACTERISTICS
PWM Frequency (24)
f PWM
–
10
–
kHz
Maximum Switching Frequency During Active Current Limiting
f MAX
–
–
20
kHz
Output ON Delay (26)
t D (ON)
μ s
V+ = 14 V
Output OFF Delay (26)
V+ = 14 V
t D (OFF)
–
–
–
–
18
18
μ s
I LIM Output Constant-OFF Time for Low-Side MOSFETs
I LIM Blanking Time for Low-Side MOSFETs (29) , (28)
t A
t B
15
12
20.5
16.5
26
21
μ s
μ s
Output Rise and Fall Time (30)
t F , t R
μ s
V+ = 14 V, I OUT = 3.0 A
2.0
5.0
8.0
Disable Delay Time (31)
t D (DISABLE)
–
–
8.0
μ s
Power-ON Delay Time
t POD
–
1.0
5.0
ms
Wake-Up Delay Time (32)
t WUD
–
1.0
5.0
ms
Output MOSFET Body Diode Reverse Recovery Time
t RR
100
–
–
ns
Notes
24 The outputs can be PWM-controlled from an external source. This is typically done by holding one input high while applying a PWM
pulse train to the other input. The maximum PWM frequency obtainable is a compromise between switching losses and switching
frequency. See Typical Switching Waveforms, Figures 12 through 19 , pp. 14– 17.
25 The Maximum Switching Frequency during active current limiting is internally implemented. The internal current limit circuitry produces
a constant-OFF-time pulse-width modulation of the output current. The output load’s inductance, capacitance, and resistance
characteristics affect the total switching period (OFF-time + ON-time) and thus the PWM frequency during current limit.
26 Output Delay is the time duration from the midpoint of the IN1 or IN2 input signal to the 10% or 90% point (dependent on the transition
direction) of the OUT1 or OUT2 signal. If the output is transitioning HIGH-to-LOW, the delay is from the midpoint of the input signal to
the 90% point of the output response signal. If the output is transitioning LOW-to-HIGH, the delay is from the midpoint of the input signal
27 I LIM Output Constant-OFF Time is the time during which the internal constant-OFF time PWM current regulation circuit has tri-stated
the output bridge.
28 Load currents ramping up to the current regulation threshold become limited at the I LIM value. The short circuit currents possess a di/dt
that ramps up to the I SCH or I SCL threshold during the I LIM blanking time, registering as a short circuit event detection and causing the
shutdown circuitry to force the output into an immediate tri-state latch-OFF. See Figures 10 and 11 , page 13 . Operation in Current Limit
mode may cause junction temperatures to rise. Junction temperatures above ~160 ° C will cause the output current limit threshold to
progressively “fold back”, or decrease with temperature, until ~175 ° C is reached, after which the T LIM thermal latch-OFF will occur.
Permissible operation within this fold-back region is limited to nonrepetitive transient events of duration not to exceed 30 seconds. See
29 I LIM Blanking Time is the time during which the current regulation threshold is ignored so that the short-circuit detection threshold
comparators may have time to act.
30 Rise Time is from the 10% to the 90% level and Fall Time is from the 90% to the 10% level of the output signal. See Figure 8 , page 12 .
31 Disable Delay Time is the time duration from the midpoint of the D (disable) input signal to 10% of the output tri-state response. See
32 Parameter has been characterized but not production tested.
33 Parameter is guaranteed by design but not production tested.
33887
Analog Integrated Circuit Device Data
Freescale Semiconductor
11
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