参数资料
型号: MCZ33887EK
厂商: Freescale Semiconductor
文件页数: 34/37页
文件大小: 0K
描述: IC H-BRIDGE 5V CURR FDBK 54-SOIC
标准包装: 26
类型: 半桥
输入类型: 非反相
输出数: 2
导通状态电阻: 120 毫欧
电流 - 输出 / 通道: 5A
电流 - 峰值输出: 6.5A
电源电压: 5 V ~ 28 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 54-SSOP(0.295",7.50mm 宽)裸露焊盘
供应商设备封装: 54-SOICW-EP
包装: 管件
产品目录页面: 808 (CN2011-ZH PDF)
ADDITIONAL DOCUMENTATION
THERMAL ADDENDUM (REV 2.0)
A
Tab
AGND
FS
IN1
V+
V+
OUT1
OUT1
FB
PGND
PGND
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
EN
IN2
D1
C CP
V+
OUT2
OUT2
D2
PGND
PGND
Tab
33887 Pin Connections
20-Pin HSOP-EP
1.27 mm Pitch
16.0 mm x 11.0 mm Body
12.2 mm x 6.9 mm Exposed Pad
Figure 26. Thermal Test Board
Device on Thermal Test Board
Material:
Single layer printed circuit board
Table 8.
Thermal Resistance Performance
FR4, 1.6 mm thickness
Cu traces, 0.07 mm thickness
Thermal Resistance
R θ JA
Area A (mm 2 )
0.0
° C/W
52
Outline:
80 mm x 100 mm board area,
including edge connector for thermal
testing
300
600
36
32
Area A :
Ambient Conditions:
Cu heat spreading areas on board
surface
Natural convection, still air
R θ JS
0.0
300
600
10
7.0
6.0
R θ JA is the thermal resistance between die junction and
ambient air.
R θ JS is the thermal resistance between die junction and the
reference location on the board surface near a center lead of the
package (see Figure 26 ).
33887
Analog Integrated Circuit Device Data
34
Freescale Semiconductor
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