参数资料
| 型号： | NCN8024RDWR2G |
| 厂商： | ON Semiconductor |
| 文件页数： | 13/15页 |
| 文件大小： | 0K |
| 描述： | IC SMART CARD IC2 28SOIC |
| 标准包装： | 1,000 |
| 系列： | * |
NCN8024R
http://onsemi.com
7
HOST INTERFACE SECTION CLKIN, RSTIN, I/Ouc, AUX1uc, AUX2uc, CLKDIV1, CLKDIV2, CMDVCC, 5V/3V
(VDD = 3.3 V; VDDP = 5 V; Tamb = 25°C; FCLKIN = 10 MHz)
Symbol
Rating
Min
Typ
Max
Unit
27
MHz
VIL
Input Voltage Level Low: CLKIN, RSTIN, I/Ouc, AUX1uc, AUX2uc, CLKDIV1,
CLKDIV2, CMDVCC, 5V/3V
0.3
0.3 x VDD
V
VIH
Input Voltage Level High: CLKIN, RSTIN, I/O, AUX1, AUX2, CLKDIV1, CLKDIV2,
CMDVCC, 5V/3V
0.7 x VDD
VDD + 0.3
V
|IIL|
CLKDIV1, CLKDIV2, CMDVCC, RSTIN, CLKIN, 5V/3V Low Level Input Leakage
Current, VIL = 0 V
1.0
mA
|IIH|
CLKDIV1, CLKDIV2, CMDVCC, RSTIN, CLKIN, 5V/3V Low Level Input Leakage
Current, VIH = VDD
1.0
mA
VIL
Input Voltage Level Low: I/Ouc, AUX1uc, AUX2uc
0.3
0.5
V
VIH
Input Voltage Level High: I/Ouc, AUX1uc, AUX2uc
0.7 x VDD
VDD + 0.3
V
|IIL|
I/Ouc, AUX1uc, AUX2uc Low Level Input Leakage Current, VIL = 0 V
600
mA
|IIH|
I/Ouc, AUX1uc, AUX2uc High Level Input Leakage Current, VIH = VDD
10
mA
VOH
VOL
tRi/Fi
tRo/Fo
I/Ouc, AUX1uc, AUX2uc data channels, @ Cs v 30 pF
High Level Output Voltage (CRD_I/O = CRD_AUX1 = CRD_AUX2 = CRD_VCC)
IOH = 0
IOH = 40 mA for VDD > 2 V (IOH = 20 mA for VDD ≤ 2 V)
Low Level Output Voltage (CRD_I/O= CRD_AUX1 = CRD_AUX2 = 0 V)
IOL = +1 mA
Input Rising/Falling Times (Note 6)
Output Rising/Falling Times (Note 6)
0.9 x VDD
0.75 x VDD
0
VDD + 0.1
0.3
1.2
0.1
V
ms
Fbidi
Maximum Frequency through Bidirectional I/O, AUX1 and AUX2 Channels (Note 6)
1
MHz
Rpu
I/0uc, AUX1uc, AUX2uc Pullup Resistor
8.0
11
16
kW
VOH
Output High Voltage
INT @ IOH = 15 mA (Source)
0.6 x VDD
V
VOL
Output Low Voltage
INT @ IOL = 2 mA (Sink)
0
0.30
V
RINT
INT Pullup Resistor
40
50
60
kW
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed
circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the
declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device
specification limit values are applied individually under normal operating conditions and not valid simultaneously.
6. Guaranteed by design and characterization
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