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参数资料
| 型号： | PIC18F85J50T-I/PT |
| 厂商： | Microchip Technology |
| 文件页数： | 49/61页 |
| 文件大小： | 0K |
| 描述： | IC PIC MCU FLASH 16KX16 80TQFP |
| 产品培训模块： | Asynchronous Stimulus PIC18 J Series MCU Overview |
| 标准包装： | 1,200 |
| 系列： | PIC® 18F |
| 核心处理器： | PIC |
| 芯体尺寸： | 8-位 |
| 速度： | 48MHz |
| 连通性： | EBI/EMI，I²C，SPI，UART/USART，USB |
| 外围设备： | 欠压检测/复位，LVD，POR，PWM，WDT |
| 输入/输出数： | 65 |
| 程序存储器容量： | 32KB（16K x 16） |
| 程序存储器类型： | 闪存 |
| RAM 容量： | 3.8K x 8 |
| 电压 - 电源 (Vcc/Vdd)： | 2 V ~ 3.6 V |
| 数据转换器： | A/D 12x10b |
| 振荡器型： | 内部 |
| 工作温度： | -40°C ~ 85°C |
| 封装/外壳： | 80-TQFP |
| 包装： | 带卷 (TR) |
| 配用： | AC162087-ND - HEADER MPLAB ICD2 18F87J50 68/84 MA180021-ND - MODULE PLUG-IN 18F87J50 FS USB AC164328-ND - MODULE SKT FOR 80TQFP |
| 其它名称： | PIC18F85J50T-I/PTTR |
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Philips Semiconductors
Product data
P87LPC767
Low power, low price, low pin count (20 pin)
microcontroller with 4-kbyte OTP and 8-bit A/D converter
2002 Mar 25
50
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIO
Offset voltage comparator inputs1
±10
mV
VCR
Common mode range comparator inputs
0
VDD–0.3
V
CMRR
Common mode rejection ratio1
–50
dB
Response time
250
500
ns
Comparator enable to output valid
10
s
IIL
Input leakage current, comparator
0 < VIN < VDD
±10
A
NOTE:
1. This parameter is guaranteed by characterization, but not tested in production.
A/D CONVERTER DC ELECTRICAL CHARACTERISTICS
Vdd = 3.0 V to 6.0 V unless otherwise specified;
Tamb = 0 to +70
°C for commercial, -40 °C to +85 °C for industrial, or –40 °C to +125 °C for extended industrial, unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
MAX
UNIT
AVIN
Analog input voltage
VSS - 0.2
VDD + 0.2
V
RREF
Resistance between VDD and VSS
A/D enabled
tbd
k
CIA
Analog input capacitance
15
pF
DLe
Differential non-linearity1,2,3
±1
LSB
ILe
Integral non-linearity1,4
±1
LSB
OSe
Offset error1,5
±1
LSB
Ge
Gain error1,6
±1
%
Ae
Absolute voltage error1,7
±1
LSB
MCTC
Channel-to-channel matching
±1
LSB
Ct
Crosstalk between inputs of port8
0 to 100 kHz
-60
dB
-
Input slew rate
100
V/ms
-
Input source impedance
10
k
NOTES:
1. Conditions: VSS = 0 V; VDD = 5.12 V.
2. The A/D is monotonic, there are no missing codes
3. The differential non-linearity (DLe) is the difference between the actual step width and the ideal step width. See Figure 40.
4. The integral non-linearity (ILe) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 40.
5. The offset error (OSe) is the absolute difference between the straight line which fits the actual transfer curve (after removing gain error), and
the straight line which fits the ideal transfer curve. See Figure 40.
6. The gain error (Ge) is the relative difference in percent between the straight line fitting the actual transfer curve (after removing offset error),
and the straight line which fits the ideal transfer curve. Gain error is constant at every point on the transfer curve. See Figure 40.
7. The absolute voltage error (Ae) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated
ADC and the ideal transfer curve.
8. This should be considered when both analog and digital signals are input simultaneously to A/D pins.
9. Changing the input voltage faster than this may cause erroneous readings.
10. A source impedance higher than this driving an A/D input may result in loss of precision and erroneous readings.
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