参数资料
型号: PPC5604BCLL48
厂商: Freescale Semiconductor
文件页数: 67/109页
文件大小: 0K
描述: MCU 32BIT 512K 48MHZ
标准包装: 90
系列: MPC56xx Qorivva
核心处理器: e200z0h
芯体尺寸: 32-位
速度: 48MHz
连通性: CAN,I²C,LIN,SCI,SPI
外围设备: POR,PWM,WDT
输入/输出数: 79
程序存储器容量: 512KB(512K x 8)
程序存储器类型: 闪存
EEPROM 大小: 4K x 16
RAM 容量: 32K x 8
电压 - 电源 (Vcc/Vdd): 3 V ~ 3.6 V
数据转换器: A/D 28x10b
振荡器型: 内部
工作温度: -40°C ~ 85°C
封装/外壳: 100-LQFP
包装: 托盘
MPC5604B/C Microcontroller Data Sheet, Rev. 11.1
Package pinouts and signal descriptions
Freescale Semiconductor
60
3.20.3.2
Static latch-up (LU)
Two complementary static tests are required on six parts to assess the latch-up performance:
A supply overvoltage is applied to each power supply pin.
A current injection is applied to each input, output and configurable I/O pin.
These tests are compliant with the EIA/JESD 78 IC latch-up standard.
3.21
Fast external crystal oscillator (4 to 16 MHz) electrical
characteristics
The device provides an oscillator/resonator driver. Figure 14 describes a simple model of the internal oscillator driver and
provides an example of a connection for an oscillator or a resonator.
Table 36 provides the parameter description of 4 MHz to 16 MHz crystals used for the design simulations.
Table 34. ESD absolute maximum ratings1 2
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated
Circuits.
2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification requirements. Complete DC parametric and functional testing shall be performed per applicable
device specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Symbol
C
Ratings
Conditions
Class
Max value
Unit
VESD(HBM) CC T Electrostatic discharge voltage
(Human Body Model)
TA = 25 °C
conforming to AEC-Q100-002
H1C
2000
V
VESD(MM) CC T Electrostatic discharge voltage
(Machine Model)
TA = 25 °C
conforming to AEC-Q100-003
M2
200
VESD(CDM) CC T Electrostatic discharge voltage
(Charged Device Model)
TA = 25 °C
conforming to AEC-Q100-011
C3A
500
750 (corners)
Table 35. Latch-up results
Symbol
C
Parameter
Conditions
Class
LU
CC
T Static latch-up class
TA = 125 °C
conforming to JESD 78
II level A
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