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参数资料
| 型号： | RM100355WFQMLV |
| 厂商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分类： | 锁存器 |
| 英文描述： | 100K SERIES, LOW LEVEL TRIGGERED D LATCH, COMPLEMENTARY OUTPUT, CQFP24 |
| 封装： | CERQUAD-24 |
| 文件页数： | 7/12页 |
| 文件大小： | 188K |
| 代理商： | RM100355WFQMLV |
Absolute Maximum Ratings (Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above
which the useful life may be impaired.
Storage Temperature (T
STG)
65C to +150C
Maximum Junction Temperature (T
J)
Ceramic
+175C
V
EE Pin Potential to Ground Pin
7.0V to +0.5V
Input Voltage (DC)
V
EE to +0.5V
Output Current (DC Output HIGH)
50 mA
ESD (Note 3)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C)
Military
55C to +125C
Supply Voltage (V
EE)
5.7V to 4.2V
Note 2: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE = 4.2V to 5.7V, VCC = VCCA = GND, TC = 55C to +125C
Symbol
Parameter
Min
Max
Units
T
C
Conditions
Notes
V
OH
Output HIGH Voltage
1025
870
mV
0C to +125C
1085
870
mV
55C
V
IN = VIH (Max)
Loading with
(Notes 4, 5,
6)
V
OL
Output LOW Voltage
1830
1620
mV
0C to +125C
or V
IL (Min)
50
to 2.0V
1830
1555
mV
55C
V
OHC
Output HIGH Voltage
1035
mV
0C to +125C
1085
mV
55C
V
IN = VIH (Min)
Loading with
(Notes 4, 5,
6)
V
OLC
Output LOW Voltage
1610
mV
0C to +125C
or V
IL (Max)
50
to 2.0V
1555
mV
55C
V
IH
Input HIGH Voltage
1165
870
mV
55C to
Guaranteed HIGH Signal
(Notes 4, 5,
6, 7)
+125C
for ALL Inputs
V
IL
Input LOW Voltage
1830
1475
mV
55C to
Guaranteed LOW Signal
(Notes 4, 5,
6, 7)
+125C
for ALL Inputs
I
IL
Input LOW Current
0.50
A
55C to
V
EE = 4.2V
(Notes 4, 5,
6)
+125C
V
IN = VIL (Min)
I
IH
Input HIGH Current
S
0,S1
220
E
1,E2
350
A
0C to +125C
D
na–Dnd
340
V
EE = 5.7V
MR
430
V
IN = VIH (Max)
(Notes 4, 5,
6)
S
0,S1
320
E
1,E2
500
A
55C
D
na–Dnd
490
MR
630
I
EE
Power Supply Current
95
32
mA
55C to +125C
Inputs Open
(Notes 4, 5,
6)
Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals 55C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 5: Screen tested 100% on each device at 55C, +25C, and +125C Temp., Subgroups 1, 2, 3, 7, and 8.
Note 6: Sample tested (Method 5005, Table 1) on each Mfg. lot at +25, +125C, and 55C Temp., Subgroups 1, 2, 3, 7, and 8.
Note 7: Guaranteed by applying specified input condition and testing VOH/VOL.
www.national.com
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