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参数资料
| 型号： | RM100355WFQMLV |
| 厂商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分类： | 锁存器 |
| 英文描述： | 100K SERIES, LOW LEVEL TRIGGERED D LATCH, COMPLEMENTARY OUTPUT, CQFP24 |
| 封装： | CERQUAD-24 |
| 文件页数： | 9/12页 |
| 文件大小： | 188K |
| 代理商： | RM100355WFQMLV |
Test Circuit
Switching Waveforms
DS100294-6
Notes:
VCC,VCCA = +2V, VEE = 2.5V
L1 and L2 = equal length 50
impedance lines
RT = 50 terminator internal to scope
Decoupling 0.1 F from GND to VCC and VEE
All unused outputs are loaded with 50
to GND
CL = Fixture and stray capacitance ≤ 3pF
Pin numbers shown are for flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
(Using Quad Cerpak)
DS100294-7
FIGURE 2. Enable Timing
www.national.com
6
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