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| 型号： | SCANPSC110FSCX |
| 厂商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分类： | 微控制器/微处理器 |
| 中文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, PDSO28 |
| 封装： | 0.300 INCH, MS-013, SOIC-28 |
| 文件页数： | 1/25页 |
| 文件大小： | 269K |
| 代理商： | SCANPSC110FSCX |
2000 Fairchild Semiconductor Corporation
DS011570
www.fairchildsemi.com
March 1993
Revised August 2000
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SCANPSC110F
SCAN Bridge Hierarchical and Multidrop Addressable
JTAG Port (IEEE1149.1 System Test Support)
General Description
The SCANPSC110F Bridge extends the IEEE Std. 1149.1
test bus into a multidrop test bus environment. The advan-
tage of a hierarchical approach over a single serial scan
chain is improved test throughput and the ability to remove
a board from the system and retain test access to the
remaining modules. Each SCANPSC110F Bridge supports
up to 3 local scan rings which can be accessed individually
or combined serially. Addressing is accomplished by load-
ing the instruction register with a value matching that of the
Slot inputs. Backplane and inter-board testing can easily
be accomplished by parking the local TAP Controllers in
one of the stable TAP Controller states via a Park instruc-
tion. The 32-bit TCK counter enables built in self test oper-
ations to be performed on one port while other scan chains
are simultaneously tested.
Features
s True IEEE1149.1 hierarchical and multidrop addressable
capability
s The 6 slot inputs support up to 59 unique addresses, a
Broadcast Address, and 4 Multi-cast Group Addresses
s 3 IEEE 1149.1-compatible configurable local scan ports
s Mode Register allows local TAPs to be bypassed,
selected for insertion into the scan chain individually, or
serially in groups of two or three
s 32-bit TCK counter
s 16-bit LFSR Signature Compactor
s L4
s local TAPs can be 3-stated via the OE input to allow an
alternate test master to take control of the local TAPs
Ordering Code:
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Pin Descriptions
Order Number
Package Number
Package Description
SCANPSC110FSC
M28B
28-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Pin
Names
Description
TCKB
Backplane Test Clock Input
TMSB
Backplane Test Mode Select Input
TDIB
Backplane Test Data Input
TDOB
Backplane Test Data Output
TRST
Asynchronous Test Reset Input (Active LOW)
S(0,5)
Address Select Port
OE
Local Scan Port Output Enable (Active LOW)
TCKL(1–3) Local Port Test Clock Output
TMSL(1–3) Local Port Test Mode Select Output
TDIL(1–3)
Local Port Test Data Input
TDOL(1–3) Local Port Test Data Output
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相关代理商/技术参数 |
参数描述 |
|---|---|
| SCANSTA101 | 制造商:NSC 制造商全称:National Semiconductor 功能描述:Low Voltage IEEE 1149.1 STA Master |
| SCANSTA101_06 | 制造商:NSC 制造商全称:National Semiconductor 功能描述:Low Voltage IEEE 1149.1 STA Master |
| SCANSTA101SM | 功能描述:接口 - 专用 RoHS:否 制造商:Texas Instruments 产品类型:1080p60 Image Sensor Receiver 工作电源电压:1.8 V 电源电流:89 mA 最大功率耗散: 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:BGA-59 |
| SCANSTA101SM/NOPB | 功能描述:接口 - 专用 Low Vltg IEEE 1149.1 Sys Test Access RoHS:否 制造商:Texas Instruments 产品类型:1080p60 Image Sensor Receiver 工作电源电压:1.8 V 电源电流:89 mA 最大功率耗散: 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:BGA-59 |
| SCANSTA101SM/NOPB | 制造商:Texas Instruments 功能描述:Test Master IC |
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