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参数资料
| 型号： | SCANPSC110FSCX |
| 厂商： | FAIRCHILD SEMICONDUCTOR CORP |
| 元件分类： | 微控制器/微处理器 |
| 中文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, PDSO28 |
| 封装： | 0.300 INCH, MS-013, SOIC-28 |
| 文件页数： | 19/25页 |
| 文件大小： | 269K |
| 代理商： | SCANPSC110FSCX |
3
www.fairchildsemi.com
SCANPSC1
10F
TABLE 2. Detailed Pin Description Table
Note 1: All pins are active HIGH unless otherwise noted.
Name
I/O (Note 1)
Pin #
Description
(SOIC & LCC)
TMSB
TTL Input w/Pull-Up Resistor
10
BACKPLANE TEST MODE SELECT: Controls sequencing
through the TAP Controller of the SCANPSC110F Bridge. Also
controls sequencing of the TAPs which are on the three (3) local
scan chains.
TDIB
TTL Input w/Pull-Up Resistor
12
BACKPLANE TEST DATA INPUT: All backplane scan data is
supplied to the SCANPSC110F through this input pin.
TDOB
3-STATEable,
13
BACKPLANE TEST DATA OUTPUT: This output drives test data
from the SCANPSC110F and the local TAPs, back toward the scan
master controller.
32 mA/64 mA Drive,
Reduced-Swing,
Output
TCKB
TTL Schmitt Trigger Input
11
TEST CLOCK INPUT FROM THE BACKPLANE: This is the mas-
ter clock signal that controls all scan operations of the
SCANPSC110F and of the three (3) local scan ports.
TRST
TTL Input w/Pull-Up Resistor
9
TEST RESET: An asynchronous reset signal (active LOW) which
initializes the SCANPSC110F logic.
S(0–5)
TTL Inputs
2, 3, 4,
SLOT IDENTIFICATION: The configuration of these six (6) pins is
used to identify (assign a unique address to) each SCANPSC110F
on the system backplane.
5, 6, 7
OE
TTL Input
1
OUTPUT ENABLE for the Local Scan Ports, active LOW. When
HIGH, this active-LOW control signal 3-STATEs all three local scan
ports on the SCANPSC110F, to enable an alternate resource to
access one or more of the three (3) local scan chains.
TDOL(1–3) 3-STATEable,
15,19,
TEST DATA OUTPUTS: Individual output for each of the three (3)
local scan ports.
24 mA/24 mA
24
Drive Outputs
TDIL(1–3) TTL Inputs w/Pull-Up
18, 23,
TEST DATA INPUTS: Individual scan data input for each of the
three (3) local scan ports.
Resistors
27
TMSL(1–3) 3-STATEable,
16, 20,
TEST MODE SELECT OUTPUTS: Individual output for each of the
three (3) local scan ports. TMSL does not provide a pull-up resistor
(which is assumed to be present on a connected TMS input, per
the IEEE 1149.1 requirement)
24 mA/24 mA
25
Drive Outputs
TCKL(1–3) 3-STATEable,
17, 22,
LOCAL TEST CLOCK OUTPUTS: Individual output for each of
the three (3) local scan ports. These are buffered versions of
TCKB.
24 mA/24 mA
26
Drive Output
VCC
Power Supply Voltage
8, 28
Power supply pins, 5.0V
±10%.
GND
Ground potential
14, 21
Power supply pins 0V.
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| SCANSTA101 | 制造商:NSC 制造商全称:National Semiconductor 功能描述:Low Voltage IEEE 1149.1 STA Master |
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