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| 型号： | SN54LVTH182646A |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位收发器和寄存器（3.3 ABT生根粉扫描检测装置（18位收发器和寄存器）） |
| 文件页数： | 26/36页 |
| 文件大小： | 829K |
| 代理商： | SN54LVTH182646A |
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SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS311D – MARCH 1994 – REVISED JUNE 1997
26
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 14. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(see Note 1)
Voltage range applied to any output in the high or power-off state, V
O
(see Note 1)
Current into any output in the low state, I
O
: SN54LVTH18646A
–0.5 V to 4.6 V
–0.5 V to 7 V
–0.5 V to 7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . .
96 mA
96 mA
30 mA
128 mA
128 mA
30 mA
48 mA
48 mA
30 mA
64 mA
64 mA
30 mA
–50 mA
–50 mA
67
°
C/W
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. . . . . . . . . . . . . . . .
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SN54LVTH182646A (A port or TDO)
SN54LVTH182646A (B port)
SN74LVTH18646A
. . . . . . . . . . . . . . . . . . . .
SN74LVTH182646A (A port or TDO)
SN74LVTH182646A (B port)
SN54LVTH182646A (A port or TDO)
SN54LVTH182646A (B port)
SN74LVTH18646A
SN74LVTH182646A (A port or TDO)
SN74LVTH182646A (B port)
Current into any output in the high state, I
O
(see Note 2): SN54LVTH18646A
. . . .
. . . . . . . . . . .
. . . .
. . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Package thermal impedance,
θ
JA
(see Note 3): PM package
Storage temperature range, T
stg
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. This current flows only when the output is in the high state and VO > VCC.
3. The package thermal impedance is calculated in accordance with JESD 51.
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–65
°
C to 150
°
C
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| SN54LVTH182652A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
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