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| 型号： | SN54LVTH182646A |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位收发器和寄存器（3.3 ABT生根粉扫描检测装置（18位收发器和寄存器）） |
| 文件页数： | 28/36页 |
| 文件大小： | 829K |
| 代理商： | SN54LVTH182646A |
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SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS311D – MARCH 1994 – REVISED JUNE 1997
28
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH18646A
MIN
TYP
SN74LVTH18646A
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 2.7 V,
VCC = MIN to MAX,
VCC = 2.7 V,
II = –18 mA
IOH = –100
μ
A
IOH = –3 mA
IOH = –8 mA
IOH = –24 mA
IOH = –32 mA
IOL = 100
μ
A
IOL = 24 mA
IOL = 16 mA
IOL = 32 mA
IOL = 48 mA
IOL = 64 mA
VI = VCC or GND
VI = 5.5 V
VI = 5.5 V
VI = VCC
VI = 0
VI = 5.5 V
VI = VCC
VI = 0
VI or VO = 0 to
4.5 V
VI = 0.8 V
VI = 2 V
VO = 3 V
VO = 0.5 V
VO = 0.5 V or 3 V
VO = 0.5 V or 3 V
Outputs high
–1.2
–1.2
V
VOH
VCC–0.2
VCC–0.2
V
2.4
2.4
VCC = 3 V
2.4
2.4
2
2
VOL
VCC= 2 7 V
VCC = 2.7 V
0.2
0.2
V
0.5
0.5
VCC= 3 V
VCC = 3 V
0.4
0.4
0.5
0.5
0.55
0.55
±
1
10
II
CLK, DIR,
S, TCK
VCC = 3.6 V,
VCC = 0 or MAX,
±
1
10
OE TDI
OE, TDI,
TMS
VCC = 3.6 V
3 6 V
50
50
1
1
μ
A
–25
–100
–25
–100
A or B
ports§
VCC = 3.6 V
3 6 V
20
20
1
1
–5
–5
Ioff
VCC = 0,
±
100
500
μ
A
II(h ld)
A or B
ports
VCC= 3 V
VCC = 3 V
75
150
500
75
150
μ
A
II(hold)
–75
–150
–500
–75
–150
–500
IOZH
IOZL
IOZPU
IOZPD
TDO
VCC = 3.6 V,
VCC = 3.6 V,
VCC = 0 to 1.5 V,
VCC = 1.5 V to 0,
1
1
μ
A
μ
A
μ
A
μ
A
TDO
–1
±
50
±
50
–1
±
50
±
50
TDO
TDO
ICC
VCC = 3.6 V,
IO
VI = VCC or GND
0.6
2
0.6
2
Outputs low
20
24
20
24
mA
Outputs disabled
0.6
2
0.6
2
ICC#
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
0.5
0.5
mA
Ci
Cio
Co
4
4
pF
10
10
pF
8
8
pF
All typical values are at VCC = 3.3 V, TA = 25
°
C.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
§Unused pins at VCC or GND
The parameter II(hold) includes the off-state output leakage current.
#This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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