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| 型号： | SN54LVTH182646A |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位收发器和寄存器（3.3 ABT生根粉扫描检测装置（18位收发器和寄存器）） |
| 文件页数： | 29/36页 |
| 文件大小： | 829K |
| 代理商： | SN54LVTH182646A |
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SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS311D – MARCH 1994 – REVISED JUNE 1997
29
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 15)
SN54LVTH18646A
VCC = 3.3 V
±
0.3 V
SN74LVTH18646A
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
CLKAB or CLKBA
0
120
0
100
0
120
0
100
MHz
Pulse duration
CLKAB or CLKBA high or low
A before CLKAB
↑
or
B before CLKBA
↑
A after CLKAB
↑
or
B after CLKBA
↑
3.8
5
3.8
5
ns
tsu
Setup time
2.9
3.1
2.9
3.1
ns
th
Hold time
0.8
0.2
0.8
0.2
ns
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 15)
SN54LVTH18646A
VCC = 3.3 V
±
0.3 V
SN74LVTH18646A
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
0
40
0
50
0
40
MHz
Pulse duration
TCK high or low
9.5
10.5
9.5
10.5
ns
tsu
Setup time
A, B, CLK, DIR, OE or S
before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, DIR, OE or S
after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
6.5
7
6.5
7
ns
2.5
3.5
2.5
3.5
2.5
3.5
2.5
3.5
th
Hold time
1.5
1
1.5
1
ns
1.5
1
1.5
1
1.5
1
1.5
1
td
tr
Delay time
50
50
50
50
ns
μ
s
Rise time
1
1
1
1
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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