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参数资料
| 型号： | SN54LVTH18512 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3VABT扫描测试装置（18位通用总线收发器）） |
| 文件页数： | 24/34页 |
| 文件大小： | 726K |
| 代理商： | SN54LVTH18512 |
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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671A – AUGUST 1996 – REVISED JUNE 1997
24
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 13. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(see Note 1)
Voltage range applied to any output in the high or power-off state, V
O
(see Note 1)
Current into any output in the low state, I
O
: SN54LVTH18512
–0.5 V to 4.6 V
–0.5 V to 7 V
–0.5 V to 7 V
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. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . .
96 mA
96 mA
30 mA
128 mA
128 mA
30 mA
48 mA
48 mA
30 mA
64 mA
64 mA
30 mA
–50 mA
–50 mA
73
°
C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN54LVTH182512 (A port or TDO)
SN54LVTH182512 (B port)
SN74LVTH18512
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74LVTH182512 (A port or TDO)
SN74LVTH182512 (B port)
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. . . . . . . . . . . . . . . . . . . . .
Current into any output in the high state, I
O
(see Note 2): SN54LVTH18512
SN54LVTH182512 (A port or TDO)
SN54LVTH182512 (B port)
SN74LVTH18512
SN74LVTH182512 (A port or TDO)
SN74LVTH182512 (B port)
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. . . . . .
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Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Package thermal impedance,
JA
(see Note 3): DGG package
Storage temperature range, T
stg
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. This current only flows when the output is in the high state and VO > VCC.
3. The package thermal impedance is calculated in accordance with JESD 51.
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–65
°
C to 150
°
C
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH182512 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH18514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN74LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
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