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| 型号： | SN54LVTH18512 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3VABT扫描测试装置（18位通用总线收发器）） |
| 文件页数： | 26/34页 |
| 文件大小： | 726K |
| 代理商： | SN54LVTH18512 |
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SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671A – AUGUST 1996 – REVISED JUNE 1997
26
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH18512
MIN
TYP
SN74LVTH18512
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 2.7 V,
VCC = 2.7 V to 3.6 V,
VCC = 2.7 V,
II = –18 mA
IOH = –100
μ
A
IOH = –3 mA
IOH = –8 mA
IOH = –24 mA
IOH = –32 mA
IOL = 100
μ
A
IOL = 24 mA
IOL = 16 mA
IOL = 32 mA
IOL = 48 mA
IOL = 64 mA
VI = VCC or GND
VI = 5.5 V
VI = 5.5 V
VI = VCC
VI = 0
VI = 5.5 V
VI = VCC
VI = 0
VI or VO = 0 to
4.5 V
VI = 0.8 V
VI = 2 V
VO = 3 V
VO = 0.5 V
VO = 0.5 V or 3 V
VO = 0.5 V or 3 V
Outputs high
–1.2
–1.2
V
VOH
VCC–0.2
VCC–0.2
V
2.4
2.4
VCC = 3 V
2.4
2.4
2
2
VOL
VCC= 2 7 V
VCC = 2.7 V
0.2
0.2
V
0.5
0.5
VCC= 3 V
VCC = 3 V
0.4
0.4
0.5
0.5
0.55
0.55
±
1
10
II
CLK,
LE, TCK
VCC = 3.6 V,
VCC = 0 or 3.6 V,
±
1
10
OE,
TDI, TMS
VCC = 3.6 V
3 6 V
5
5
1
1
μ
A
–25
–100
–25
–100
A or B
ports
VCC = 3.6 V
3 6 V
20
20
1
1
–5
–5
Ioff
VCC = 0,
±
100
500
μ
A
II(h ld)§
A or B
ports
VCC= 3 V
VCC = 3 V
75
500
75
150
μ
A
II(hold)§
–75
–500
–75
–150
–500
IOZH
IOZL
IOZPU
IOZPD
TDO
VCC = 3.6 V,
VCC = 3.6 V,
VCC = 0 to 1.5 V,
VCC = 1.5 V to 0,
1
1
μ
A
μ
A
μ
A
μ
A
TDO
–1
±
50
±
50
–1
±
50
±
50
TDO
TDO
ICC
VCC = 3.6 V,
IO
VI = VCC or GND
3
Outputs low
30
mA
Outputs disabled
3
ICC
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
0.5
0.5
mA
Ci
Cio
Co
4
4
pF
10
10
pF
8
8
pF
All typical values are at VCC = 3.3 V, TA = 25
°
C.
Unused pins at VCC or GND
§The parameter II(hold) includes the off-state output leakage current.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
P
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|---|---|
| SN54LVTH182512 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH18514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN74LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
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