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| 型号： | SN54LVTH18516 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3VABT扫描测试装置（18位通用总线收发器）） |
| 文件页数： | 28/36页 |
| 文件大小： | 769K |
| 代理商： | SN54LVTH18516 |
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SN54LVTH18516, SN54LVTH182516, SN74LVTH18516, SN74LVTH182516
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS672B – AUGUST 1996 – REVISED JUNE 1997
28
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH18516
MIN
TYP
SN74LVTH18516
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 2.7 V,
VCC = 2.7 V to 3.6 V,
VCC = 2.7 V,
II = –18 mA
IOH = –100
μ
A
IOH = –3 mA
IOH = –8 mA
IOH = –24 mA
IOH = –32 mA
IOL = 100
μ
A
IOL = 24 mA
IOL = 16 mA
IOL = 32 mA
IOL = 48 mA
IOL = 64 mA
VI = VCC or GND
VI = 5.5 V
VI = 5.5 V
VI = VCC
VI = 0
VI = 5.5 V
VI = VCC
VI = 0
VI or VO = 0 to
4.5 V
VI = 0.8 V
VI = 2 V
VO = 3 V
VO = 0.5 V
VO = 3 V or 0.5 V
VO = 3 V or 0.5 V
–1.2
–1.2
V
VOH
VCC–0.2
VCC–0.2
V
2.4
2.4
VCC = 3 V
2.4
2.4
2
2
VOL
VCC= 2 7 V
VCC = 2.7 V
0.2
0.2
V
0.5
0.5
VCC= 3 V
VCC = 3 V
0.4
0.4
0.5
0.5
0.55
0.55
±
1
10
II
VCC = 3.6 V,
VCC = 0 or 3.6 V,
CLK, CLKEN,
LE, S, TCK
±
1
10
VCC= 3 6 V
VCC = 3.6 V
3 6 V
3 6 V
50
50
OE, TDI, TMS
1
1
μ
A
–25
–100
–25
–100
A or B ports
20
20
1
1
–5
–5
Ioff
VCC = 0,
±
100
μ
A
II(h ld)§
VCC= 3 V
VCC = 3 V
A or B ports
75
75
μ
A
II(hold)§
–75
–75
IOZH
IOZL
IOZPU
IOZPD
VCC = 3.6 V,
VCC = 3.6 V,
VCC = 0 to 1.5 V,
VCC = 1.5 V to 0,
TDO
1
1
μ
A
μ
A
μ
A
μ
A
TDO
–1
±
50
±
50
–1
±
50
±
50
TDO
TDO
ICC
VCC= 3 6 V IO= 0 VI= VCCor GND
VCC = 3.6 V, IO = 0, VI = VCC or GND
3 6 V I
0 V
Outputs high
3
Outputs low
30
mA
Outputs
disabled
3
ICC
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
All typical values are at VCC = 3.3 V, TA = 25
°
C.
Unused pins at VCC or GND
§The parameter II(hold) includes the off-state output leakage current.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
0.2
0.2
mA
Ci
Cio
Co
4
4
pF
10
10
pF
8
8
pF
P
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| SN74LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器)) |
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