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| 型号： | SN54LVTH18516 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位通用总线收发器（3.3VABT扫描测试装置（18位通用总线收发器）） |
| 文件页数： | 33/36页 |
| 文件大小： | 769K |
| 代理商： | SN54LVTH18516 |
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SN54LVTH18516, SN54LVTH182516, SN74LVTH18516, SN74LVTH182516
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS672B – AUGUST 1996 – REVISED JUNE 1997
33
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH182516
MIN
TYP
SN74LVTH182516
MIN
TYP
UNIT
MAX
MAX
Ci
Cio
Co
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
4
4
pF
10
10
pF
8
8
pF
All typical values are at VCC = 3.3 V, TA = 25
°
C.
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 15)
123
SN54LVTH182516
VCC = 3.3 V
±
0.3 V
SN74LVTH182516
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
5
ns
LEAB or LEBA high
A before CLKAB
↑
or
B before CLKBA
↑
4
ns
Setup time
4
tsu
A before LEAB
↓
or
B before LEBA
↓
CLK high
2
ns
CLK low
2
CLKEN before CLK
↑
A after CLKAB
↑
or
B after CLKBA
↑
A after LEAB
↓
or B after LEBA
↓
CLKEN after CLK
↑
3
th
Hold time
2
ns
4
1
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 15)
SN54LVTH182516
VCC = 3.3 V
±
0.3 V
SN74LVTH182516
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
MHz
Pulse duration
TCK high or low
9.5
ns
tsu
Setup time
A, B, CLK, CLKEN, LE,
OE or S before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, CLKEN,
OE or S after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
6.5
ns
2.5
2.5
th
Hold time
1.5
ns
1.5
1.5
td
tr
Delay time
50
ns
μ
s
Rise time
1
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN74LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN54LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
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