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参数资料
| 型号： | SN54LVTH18640 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位反相总线收发器（3.3V的ABT生根粉扫描检测装置（18位反相总线收发器）） |
| 文件页数： | 28/34页 |
| 文件大小： | 707K |
| 代理商： | SN54LVTH18640 |
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SN54LVTH18640, SN54LVTH182640, SN74LVTH18640, SN74LVTH182640
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS310C – MARCH 1994 – REVISED DECEMBER 1996
28
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (normal mode) (see Note 4 and Figure 14)
123
PARAMETER
FROM
(INPUT)
TO
SN54LVTH18640
VCC = 3.3 V
±
0.3 V
SN74LVTH18640
VCC = 3.3 V
±
0.3 V
UNIT
(OUTPUT)
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
1.5
MAX
5.5
MIN
MAX
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
A or B
B or A
ns
1.5
5.5
OE
B or A
2
9.5
ns
2
9.5
OE
B or A
2.5
10.5
ns
2.5
9.5
NOTE 4: Product preview specifications are design goals only and are subject to change without notice.
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (test mode) (see Note 4 and Figure 14)
PARAMETER
FROM
(INPUT)
TO
SN54LVTH18640
VCC = 3.3 V
±
0.3 V
SN74LVTH18640
VCC = 3.3 V
±
0.3 V
UNIT
(OUTPUT)
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fmax
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPZH
tPZL
tPHZ
tPLZ
tPHZ
tPLZ
TCK
↓
50
MHz
TCK
↓
A or B
2.5
15
ns
2.5
15
TCK
↓
TDO
1.5
7
ns
1.5
7
TCK
↓
A or B
3
18
ns
3
18
TCK
↓
TDO
1.5
7
ns
1.5
7
TCK
↓
A or B
3
19
ns
3
19
TCK
↓
TDO
1.5
8
ns
1.5
8
NOTE 4: Product preview specifications are design goals only and are subject to change without notice.
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN74LVTH182640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN74LVTH18640 | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| SN54LVTH18646A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| SN54LVTH182646A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
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| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
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