参数资料
型号: SN54LVTH18640
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
中文描述: 的3.3V ABT生根粉扫描测试设备与18位反相总线收发器(3.3V的ABT生根粉扫描检测装置(18位反相总线收发器))
文件页数: 30/34页
文件大小: 707K
代理商: SN54LVTH18640
SN54LVTH18640, SN54LVTH182640, SN74LVTH18640, SN74LVTH182640
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS310C – MARCH 1994 – REVISED DECEMBER 1996
30
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Note 4)
PARAMETER
TEST CONDITIONS
SN54LVTH182640
MIN
TYP
SN74LVTH182640
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 2.7 V,
VCC = MIN to MAX,
VCC = 2.7 V,
II = –18 mA
IOH = –100
μ
A
IOH = –3 mA
IOH = –8 mA
IOH = –24 mA
IOH = –32 mA
IOH = –12 mA
IOL = 100
μ
A
IOL = 24 mA
IOL = 16 mA
IOL = 32 mA
IOL = 48 mA
IOL = 64 mA
IOL = 12 mA
VI = VCC or GND
VI = 5.5 V
VI = 5.5 V
VI = VCC
VI = 0
VI = 5.5 V
VI = VCC
VI = 0
VI or VO = 0 to
4.5 V
VI = 0.8 V
VI = 2 V
VO = 3 V
VO = 0.5 V
VO = 0.5 V or 3 V
VO = 0.5 V or 3 V
Outputs high
–1.2
–1.2
V
VOH
A port,
TDO
VCC–0.2
VCC–0.2
V
2.4
2.4
VCC = 3 V
2.4
2.4
2
2
B port
VCC = 3 V,
2
2
VOL
A port,
TDO
VCC= 2 7 V
VCC = 2.7 V
0.2
0.2
V
0.5
0.5
VCC= 3 V
VCC = 3 V
0.4
0.4
0.5
0.5
0.55
0.55
B port
VCC = 3 V,
VCC = 3.6 V,
VCC = 0 or MAX,
0.8
±
1
10
0.8
±
1
10
II
DIR TCK
DIR, TCK
OE TDI
OE, TDI,
TMS
VCC = 3.6 V
3 6 V
50
50
1
1
μ
A
–25
–100
–25
–100
A or B
ports§
VCC = 3.6 V
3 6 V
20
20
1
1
–5
–5
Ioff
VCC = 0,
±
100
500
μ
A
II(h ld)
A or B
ports
VCC= 3 V
VCC = 3 V
75
500
75
150
μ
A
II(hold)
–75
–500
–75
–170
–500
IOZH
IOZL
IOZPU
IOZPD
TDO
VCC = 3.6 V,
VCC = 3.6 V,
VCC = 0 to 1.5 V,
VCC = 1.5 V to 0,
1
1
μ
A
μ
A
μ
A
μ
A
TDO
–1
±
50
±
50
–1
±
50
±
50
TDO
TDO
ICC
VCC = 3.6 V,
IO
VI = VCC or GND
2
2
Outputs low
35
35
mA
Outputs disabled
2
2
ICC#
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
0.2
0.2
mA
Ci
Cio
Co
4
4
pF
11
11
pF
8
8
pF
All typical values are at VCC = 3.3 V, TA = 25
°
C.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
§Unused pins at VCC or GND
The parameter II(hold) includes the off-state output leakage current.
#This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
NOTE 4: Product preview specifications are design goals only and are subject to change without notice.
P
相关PDF资料
PDF描述
SN54LVTH182640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN74LVTH182640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN74LVTH18640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN54LVTH18646A 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器))
SN54LVTH182646A 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器))
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