参数资料
型号: SN54LVTH18640
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
中文描述: 的3.3V ABT生根粉扫描测试设备与18位反相总线收发器(3.3V的ABT生根粉扫描检测装置(18位反相总线收发器))
文件页数: 3/34页
文件大小: 707K
代理商: SN54LVTH18640
SN54LVTH18640, SN54LVTH182640, SN74LVTH18640, SN74LVTH182640
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS310C – MARCH 1994 – REVISED DECEMBER 1996
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
functional block diagram
Boundary-Control
Register
Bypass Register
Identification
Register
Boundary-Scan Register
Instruction Register
TDI
TMS
TCK
TDO
1DIR
1OE
1A1
1B1
One of Nine Channels
2DIR
2OE
2A1
2B1
One of Nine Channels
TAP
Controller
VCC
VCC
1
56
55
26
31
43
30
28
29
2
14
27
VCC
VCC
P
相关PDF资料
PDF描述
SN54LVTH182640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN74LVTH182640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN74LVTH18640 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器))
SN54LVTH18646A 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器))
SN54LVTH182646A 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器))
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