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| 型号： | SN74ABT18504PMRG4 |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 总线收发器 |
| 英文描述： | ABT SERIES, 20-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64 |
| 封装： | GREEN, PLASTIC, LQFP-64 |
| 文件页数： | 29/32页 |
| 文件大小： | 505K |
| 代理商： | SN74ABT18504PMRG4 |
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SN54ABT18504, SN74ABT18504
SCAN TEST DEVICES WITH
20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS108B – AUGUST 1992 – REVISED JUNE 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
6
test architecture
Serial test information is conveyed by means of a 4-wire test bus or test access port (TAP), that conforms to IEEE
Standard 1149.1-1990. Test instructions, test data, and test control signals are all passed along this serial test
bus. The TAP controller monitors two signals from the test bus, namely TCK and TMS. The function of the TAP
controller is to extract the synchronization (TCK) and state control (TMS) signals from the test bus and generate
the appropriate on-chip control signals for the test structures in the device. Figure 1 shows the TAP controller
state diagram.
The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and
output data changes on the falling edge of TCK. This scheme ensures that data to be captured is valid for fully
one-half of the TCK cycle.
The functional block diagram illustrates the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan
architecture and the relationship between the test bus, the TAP controller, and the test registers. As illustrated,
the device contains an 8-bit instruction register and four test data registers: an 88-bit boundary-scan register,
a 23-bit boundary-control register, a 1-bit bypass register, and a 32-bit device identification register.
Test-Logic-Reset
Run-Test/Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Update-DR
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-DR
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Update-IR
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-IR
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
Figure 1. TAP Controller State Diagram
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相关代理商/技术参数 |
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| SN74ABT18640 | 制造商:TI 制造商全称:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS |
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| SN74ABT18640DGGR | 功能描述:特定功能逻辑 Device w/18-Bit Inv Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18640DL | 功能描述:特定功能逻辑 Device w/18-Bit Inv Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18640DLG4 | 功能描述:特定功能逻辑 Device w/18-Bit Inv Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
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