参数资料
型号: ST72622L2T1
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 8-BIT, MROM, 8 MHz, MICROCONTROLLER, PQFP44
封装: TQFP-44
文件页数: 28/134页
文件大小: 815K
代理商: ST72622L2T1
ST7262
123/134
ADC CHARACTERISTICS (Cont’d)
ADC Accuracy with fCPU=8 MHz, fADC=4 MHz RAIN<10k
Figure 81. ADC Accuracy Characteristics
Notes:
1) ADC Accuracy vs. Negative Injection Current:
For IINJ-=0.8mA, the typical leakage induced inside the die is 1.6A and the effect on the ADC accuracy is a loss of 1 LSB
for each 10K
increase of the external analog source impedance. This effect on the ADC accuracy has been observed
under worst-case conditions for injection:
- negative injection
- injection to an Input with analog capability, adjacent to the enabled Analog Input
-at 5V VDD supply, and worst case temperature.
Symbol
Parameter
Condit ions
Typ
Max
Unit
|ET|
Total unadjusted error 1)
VDD=5V
2
±4
LSB
VDD=3V
TBD
EO
Offset error 1)
VDD=5V
TBD
VDD=3V
TBD
EG
Gain Error 1)
VDD=5V
TBD
VDD=3V
TBD
|ED|
Differential linearity error1)
VDD=5V
1.5
±3
VDD=3V
TBD
|EL|
Integral linearity error 1)
VDD=5V
TBD
VDD=3V
TBD
EO
EG
1LSBIDEAL
1LS B
ID EA L
V
DD A
V
SSA
1024
----------------------------------------
-
=
Vin (LSBIDEAL)
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset Error: deviation between the first actual
transition and the first ideal one.
EG=Gain Error: deviation between the last ideal
transition and the last actual one.
ED=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
EL=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
Digit al Result ADCDR
1023
1022
1021
5
4
3
2
1
0
7
6
12
34
5
6
7
1021 1022 1023 1024
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
1
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