参数资料
型号: ST7FLITE09Y0B3
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 8-BIT, FLASH, 8 MHz, MICROCONTROLLER, PDIP16
封装: 0.300 INCH, PLASTIC, DIP-16
文件页数: 107/115页
文件大小: 781K
代理商: ST7FLITE09Y0B3
ST7FLITE0
91/115
EMC CHARACTERISTICS (Cont’d)
13.7.2.2 Static and Dynamic Latch-Up
s
LU: 3 complementary static tests are required
on 10 parts to assess the latch-up performance.
A supply overvoltage (applied to each power
supply pin), a current injection (applied to each
input, output and configurable I/O pin) and a
power supply switch sequence are performed
on each sample. This test conforms to the EIA/
JESD 78 IC latch-up standard. For more details,
refer to the AN1181 ST7 application note.
s
DLU: Electro-Static Discharges (one positive
then one negative test) are applied to each pin
of 3 samples when the micro is running to
assess the latch-up performance in dynamic
mode. Power supplies are set to the typical
values, the oscillator is connected as near as
possible to the pins of the micro and the
component is put in reset mode. This test
conforms to the IEC1000-4-2 and SAEJ1752/3
standards and is described in Figure 61. For
more
details,
refer
to
the
AN1181
ST7
application note.
Electrical Sensitivities
Figure 61. Simplified Diagram of the ESD Generator for DLU
Notes:
1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-
ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the
JEDEC criteria (international standard).
2. Schaffner NSG435 with a pointed test finger.
Symbol
Parameter
Conditions
Class 1)
LU
Static latch-up class
TA=+25°C
TA=+85°C
A
TBD
DLU
Dynamic latch-up class
VDD=5.5V, fOSC=4MHz, TA=+25°C
A
RCH=50M
RD=330
CS=150pF
ESD
HV RELAY
DISCHAR GE TIP
DISCHARGE
RETURN CONNECTION
GENERATOR 2)
ST7
VDD
VSS
1
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