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| 型号： | STR910FAM42X6T |
| 厂商： | STMICROELECTRONICS |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | 32-BIT, FLASH, 96 MHz, RISC MICROCONTROLLER, QFP80 |
| 封装： | LQFP-80 |
| 文件页数： | 71/100页 |
| 文件大小： | 1801K |
| 代理商： | STR910FAM42X6T |
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Electrical characteristics
STR91xFAxxx
7.9.5
Static latch-up
Two complementary static tests are required on 10 parts to assess the latch-up
performance.
●
A supply overvoltage (applied to each power supply pin) and
●
A current injection (applied to each input, output and configurable I/O pin) are
performed on each sample.
This test conforms to the EIA/JESD 78 IC latch-up standard. For more details, refer to the
application note AN1181.
7.9.6
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations:
The software flowchart must include the management of runaway conditions such as:
●
Corrupted program counter
●
Unexpected reset
●
Critical Data corruption (control registers...)
Prequalification trials:
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
7.9.7
Electrical sensitivity
Table 30.
Static latch-up data
Symbol
Parameter
Conditions
Class (1)
1.
Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the
JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B
Class strictly covers all the JEDEC criteria (international standard).
LU
Static latch-up class
TA=+25°C conforming to JESD78A
II class A
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| STR910FAM44H6T | 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:ARM966E-S⑩ 16/32-Bit Flash MCU with Ethernet, USB, CAN, AC motor control, 4 timers, ADC, RTC, DMA |
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| STR910FAW32 | 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:ARM966E-S⑩ 16/32-Bit Flash MCU with Ethernet, USB, CAN, AC motor control, 4 timers, ADC, RTC, DMA |
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| STR910FAW32X6 | 功能描述:ARM微控制器 - MCU 256 + 32 64 RAM KB CAN EMI 80 I/O RoHS:否 制造商:STMicroelectronics 核心:ARM Cortex M4F 处理器系列:STM32F373xx 数据总线宽度:32 bit 最大时钟频率:72 MHz 程序存储器大小:256 KB 数据 RAM 大小:32 KB 片上 ADC:Yes 工作电源电压:1.65 V to 3.6 V, 2 V to 3.6 V, 2.2 V to 3.6 V 工作温度范围:- 40 C to + 85 C 封装 / 箱体:LQFP-48 安装风格:SMD/SMT |
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