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参数资料
| 型号： | TC253SPD-B0 |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 模拟信号调理 |
| 英文描述： | SPECIALTY ANALOG CIRCUIT, CDIP22 |
| 封装： | 1.78 MM PITCH, WINDOWED, CERAMIC, DIP-22 |
| 文件页数： | 23/23页 |
| 文件大小： | 363K |
| 代理商： | TC253SPD-B0 |
TC253SPDB0
680 × 500 PIXEL IMPACTRON CCD IMAGE SENSOR
JULY 2003 SOCS084
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating ranges of supply voltage at operating
free-air temperature (unless otherwise noted)
PARAMETER
MIN
TYP
MAX
UNIT
Charge multiplication gain
1
30
(100)§
Excess noise factor for typical CCM gain (see Note 6)
1
1.4
Dynamic range without CCM gain
64
dB
Dynamic range with typical CCM gain (see Note 7)
66
dB
Charge conversion gain without CCM gain (see Note 8)
9
V/e-
τ
Signal-response delay time (see Note 9)
9
ns
Output resistance
320
Amplifier noise-equivalent signal without CCM gain
29
e- rms
Response linearity without CCM gain
1
Response linearity with typical CCM gain
1
Charge-transfer efficiency (see Note 10)
0.9998
0.9999
Supply current
2
3
4
mA
IAG1
3
IAG2
3.2
IAG1-IAG2
2
nF
SAG1
3
nF
SAG2
3.6
Ci
Inp t capacitance
SAG1-SAG2
2.2
Ci
Input capacitance
SRG1
40
SRG2
40
SRG1SRG2
50
pF
CMG
30
pF
CMGSRG1
10
ODB
1,000
ADB high (see Note 11)
20
SRG1,2 high (Note 11)
45
P lse amplit de rejection ratio
SRG1,2 low (Note 11)
45
dB
Pulse amplitude rejection ratio
CMG high (see Note 11)
45
dB
CMD low (see Note 11)
45
OBD low (see Note 11)
45
The values in the table are quoted using CDS = correlated double sampling. CDS is a signal-processing technique that improves performance
by minimizing undesirable effects of reset noise.
All typical values are at TA = 25°C.
§ Maximum CCM gain is not ensured.
NOTES:
6. Excess noise factor F is defined as the ratio of noise sigma after multiplication divided by M times the noise sigma before
multiplication, where M is the charge multiplication gain.
7. Dynamic range is – 20 times the logarithm of the noise sigma divided by the saturation-output signal amplitude.
8. Charge-conversion factor is defined as the ratio of output signal to input number of electrons.
9. Signal-response delay time is the time between the falling edge of the SRG2 pulse and the output-signal valid state.
10. Charge transfer efficiency is one minus the charge loss per transfer in the CCD register.
11. Rejection ratio is – 20 times the logarithm of the output referenced to the reset level divided by the 1 V of amplitude change of the
corresponding gate or terminal signal.
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