参数资料
型号: TMS320F28069UPZT
厂商: Texas Instruments
文件页数: 134/174页
文件大小: 0K
描述: IC MCU 32BIT 256KB FLASH 100LQFP
产品培训模块: ControlSUITE
Piccolo F2806x
TPS75005 Single IC Power for C2000 MCU
标准包装: 90
系列: TMS320F2806x, Piccolo™, C2000™
核心处理器: C28x
芯体尺寸: 32-位
速度: 80MHz
连通性: CAN,I²C,McBSP,SCI,SPI,UART/USART
外围设备: 欠压检测/复位,DMA,POR,PWM,WDT
输入/输出数: 54
程序存储器容量: 256KB(128K x 16)
程序存储器类型: 闪存
RAM 容量: 50K x 16
电压 - 电源 (Vcc/Vdd): 1.71 V ~ 1.995 V
数据转换器: A/D 16x12b
振荡器型: 内部
工作温度: -40°C ~ 105°C
封装/外壳: 100-LQFP
包装: 托盘
Transmission Line
4.0 pF
1.85 pF
Z0 = 50 W
(A)
Tester Pin Electronics
Data Sheet Timing Reference Point
Output
Under
Test
42 W
3.5 nH
Device Pin
(B)
SPRS698D – NOVEMBER 2010 – REVISED DECEMBER 2012
5
Peripheral and Electrical Specifications
5.1
Parameter Information
5.1.1
Timing Parameter Symbology
Timing parameter symbols used are created in accordance with JEDEC Standard 100. To shorten the
symbols, some of the pin names and other related terminology have been abbreviated as follows:
Lowercase subscripts and their
Letters and symbols and their
meanings:
a
access time
H
High
c
cycle time (period)
L
Low
d
delay time
V
Valid
Unknown, changing, or don't care
f
fall time
X
level
h
hold time
Z
High impedance
r
rise time
su
setup time
t
transition time
v
valid time
w
pulse duration (width)
5.1.2
General Notes on Timing Parameters
All output signals from the 28x devices (including XCLKOUT) are derived from an internal clock such that
all output transitions for a given half-cycle occur with a minimum of skewing relative to each other.
The signal combinations shown in the following timing diagrams may not necessarily represent actual
cycles. For actual cycle examples, see the appropriate cycle description section of this document.
5.2
Test Load Circuit
This test load circuit is used to measure all switching characteristics provided in this document.
A.
Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the
device pin.
B.
The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its
transmission line effects must be taken into account. A transmission line with a delay of 2 ns or longer can be used to
produce the desired transmission line effect. The transmission line is intended as a load only. It is not necessary to
add or subtract the transmission line delay (2 ns or longer) from the data sheet timing.
Figure 5-1. 3.3-V Test Load Circuit
62
Peripheral and Electrical Specifications
Copyright 2010–2012, Texas Instruments Incorporated
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