参数资料
型号: WJLXT901ALCA4
厂商: CORTINA SYSTEMS INC
元件分类: 网络接口
英文描述: DATACOM, ETHERNET TRANSCEIVER, PQFP64
封装: ROHS COMPLIANT, LQFP-64
文件页数: 22/48页
文件大小: 621K
代理商: WJLXT901ALCA4
Intel
LXT901A/907A Universal 3.3 V Ethernet Transceiver
Datasheet
29
Document Number: 249098
Revision Number: 003
Revision Date: 27-Nov-2005
4.0
Test Specifications
Note:
Table 4 through Table 13 and Figure 17 through Figure 42 represent the performance specifications
of the LXT901A/907A Transceiver. These specifications are guaranteed by test except where noted
“by design.” Minimum and maximum values listed in Table 6 through Table 13 apply over the
recommended operating conditions specified in Table 5.
For all Quality and Reliability issues (for example, parts packaging and thermal specifications),
please send your questions to Intel at the following e-mail address: qr.requests@intel.com.
Table 4.
Absolute Maximum Values
Parameter
Symbol
Min
Max
Units
Supply voltage
VCC
-0.3
6
V
Storage temperature
TSTG
-65
+150
C
Caution:
Exceeding these values may cause permanent damage. Functional operation under these
conditions is not implied. Exposure to maximum rating conditions for extended periods may affect
device reliability.
Table 5.
Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Units
Recommended supply voltage1
VCC
3.13
3.3
3.47
V
Recommended operating temperature
(Commercial)
TOP
0–
+70
C
1. Voltages with respect to ground unless otherwise specified. Power supply should be filtered to suppress
high frequency transients, consistent with good PCB design.
Table 6.
I/O Electrical Characteristics
Parameter
Sym
Min
Typ
1
Max
Units
Test Conditions
Input Low voltage2
VIL
––
0.8
V
Input High voltage2
VIH
2.0
V
Output Low voltage
VOL
––
0.4
V
IOL = 1.6 mA
VOL
––
10
%VCC
IOL < 10 A
Output Low voltage
(Open drain LED driver)
VOLL
––
0.7
%VCC
IOLL = 10 mA
Output High voltage
VOH
2.4
V
IOH = 40 A
VOH
90
%VCC
IOH < 10 A
Output rise
time
TCLK & RCLK
CMOS
––
7
12ns
CLOAD = 20 pF
TTL
7
8
ns
1. Typical values are at 25°C and are for design aid only, are not guaranteed, and are not subject to
production testing.
2. Limited functional tests are performed at these input levels. The majority of functional tests are performed
at levels of 0V and 3V.
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