参数资料
型号: X9110TV14ZT1
厂商: Intersil
文件页数: 3/18页
文件大小: 0K
描述: IC XDCP 1024-TAP 100K 14-TSSOP
标准包装: 2,500
系列: XDCP™
接片: 1024
电阻(欧姆): 100k
电路数: 1
温度系数: 标准值 ±300 ppm/°C
存储器类型: 非易失
接口: 4 线 SPI(芯片选择,设备位址)
电源电压: 4.5 V ~ 5.5 V
工作温度: 0°C ~ 70°C
安装类型: 表面贴装
封装/外壳: 14-TSSOP(0.173",4.40mm 宽)
供应商设备封装: 14-TSSOP
包装: 带卷 (TR)
11
FN8158.3
February 13, 2008
D.C. Operating Specifications Over the recommended operating conditions unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 13)
TYP
MAX
(Note 13)
UNITS
ICC1
VCC Supply Current
(active)
fSCK = 2.5 MHz, SO = Open, VCC = 5.5V
Other Inputs = VSS
400
A
ICC2
VCC Supply Current
(nonvolatile write)
fSCK = 2.5MHz, SO = Open, VCC = 5.5V
Other Inputs = VSS
15
mA
ISB
VCC Current (standby)
SCK = SI = VSS, Addr. = VSS,
CS = VCC = 5.5V
3A
ILI
Input Leakage Current
VIN = VSS to VCC
10
A
ILO
Output Leakage Current
VOUT = VSS to VCC
10
A
VIH
Input HIGH Voltage
VCC x 0.7
VCC + 1
V
VIL
Input LOW Voltage
-1
VCC x 0.3
V
VOL
Output LOW Voltage
IOL = 3mA
0.4
V
VOH
Output HIGH Voltage
IOH = -1mA, VCC ≥ +3V
VCC - 0.8
V
VOH
Output HIGH Voltage
IOH = -0.4mA, VCC ≤ +3V
VCC - 0.4
V
Endurance and Data Retention
PARAMETER
MIN
UNITS
Minimum Endurance
100,000
Data changes per bit per register
Data Retention
100
years
Capacitance
SYMBOL
TEST
TEST CONDITIONS
MAX
UNITS
CIN/OUT (Notes 8, 10)
Input/Output Capacitance (SI)
VOUT = 0V
8
pF
COUT (Note 10)
Output Capacitance (SO)
VOUT = 0V
8
pF
CIN (Note 10)
Input Capacitance (A0, CS, WP, HOLD, and SCK)
VIN = 0V
6
pF
Power-up Timing
SYMBOL
PARAMETER
MIN
MAX
UNITS
tr VCC (Note 10)
VCC Power-up Rate
0.2
50
V/ms
tPUR (Notes 10, 11)
Power-up to Initiation of Read Operation
1
ms
tPUW (Note 11)
Power-up to Initiation of Write Operation
50
ms
NOTES:
10. Limits established by characterization and are not production tested.
11. tPUR and tPUW are the delays required from the time the (last) power supply (VCC-) is stable until the specific instruction can be issued.
12. ESD Rating on RH, RL, RW pins is 1.5kV (HBM, 1.0A leakage maximum), ESD rating on all other pins is 2.0kV.
13. Parts are 100% tested at +25°C. Over-temperature limits established by characterization and are not production tested.
A.C. Test Conditions
Input Pulse Levels
VCC x 0.1 to VCC x 0.9
Input Rise and Fall Times
10ns
Input and Output Timing Level
VCC x 0.5
X9110
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