参数资料
型号: 24C02CT-I/MNY
厂商: Microchip Technology
文件页数: 3/30页
文件大小: 0K
描述: IC EEPROM 2KBIT 400KHZ 8TDFN
标准包装: 1
格式 - 存储器: EEPROMs - 串行
存储器类型: EEPROM
存储容量: 2K (256 x 8)
速度: 400kHz
接口: I²C,2 线串口
电源电压: 4.5 V ~ 5.5 V
工作温度: -40°C ~ 85°C
封装/外壳: 8-WFDFN 裸露焊盘
供应商设备封装: 8-TDFN(2x3)
包装: 标准包装
产品目录页面: 1445 (CN2011-ZH PDF)
其它名称: 24C02CT-I/MNYDKR
24C02C
TABLE 1-2:
AC CHARACTERISTICS
Electrical Characteristics:
AC CHARACTERISTICS
Industrial (I): V CC = +4.5V to 5.5V
Automotive (E): V CC = +4.5V to 5.5V
T A = -40°C to +85°C
T A = -40°C to +125°C
Param.
No.
1
Sym.
F CLK
Characteristic
Clock frequency
Min.
Max.
100
Units
kHz
Conditions
400
(I-temp)
2
T HIGH
Clock high time
4000
ns
600
(I-temp)
3
T LOW
Clock low time
4700
ns
1300
(I-temp)
4
T R
SDA and SCL rise time
1000
ns
(Note 1)
300
(I-temp)
5
T F
SDA and SCL fall time
300
ns
(Note 1)
(I-temp)
6
T HD : STA Start condition hold time
4000
ns
600
(I-temp)
7
T SU : STA Start condition setup time
4700
ns
600
(I-temp)
8
9
T HD : DAT Data input hold time
T SU : DAT Data input setup time
0
250
ns
ns
(Note 2)
100
(I-temp)
10
T SU : STO Stop condition setup time
4000
ns
600
(I-temp)
11
T AA
Output valid from clock
3500
ns
(Note 2)
900
(I-temp)
12
T BUF
Bus free time: Time the bus
4700
ns
must be free before a new
1300
(I-temp)
transmission can start
13
T OF
Output fall time from V IH
10 + 0.1CB
250
ns
(Note 1)
minimum to V IL maximum
C B ≤ 100 pF
14
T SP
Input filter spike suppression
50
ns
(Note 3)
(SDA and SCL pins)
15
T WC
Write cycle time (byte or
1.5
ms
page)
1
(I-temp)
16
Endurance
1,000,000
cycles 25°C (Note 4)
Note 1:
2:
3:
4:
Not 100% tested. C B = total capacitance of one bus line in pF.
As a transmitter, the device must provide an internal minimum delay time to bridge the undefined region
(minimum 300 ns) of the falling edge of SCL to avoid unintended generation of Start or Stop conditions.
The combined T SP and V HYS specifications are due to new Schmitt Trigger inputs, which provide
improved noise spike suppression. This eliminates the need for a T I specification for standard operation.
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance? Model, which can be obtained from Microchip’s web site
at www.microchip.com.
? 2008 Microchip Technology Inc.
DS21202J-page 3
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