参数资料
型号: 3LN01C-TB-H
厂商: ON Semiconductor
文件页数: 2/6页
文件大小: 0K
描述: MOSFET N-CH 30V 150MA 3CP
标准包装: 3,000
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 30V
电流 - 连续漏极(Id) @ 25° C: 150mA
开态Rds(最大)@ Id, Vgs @ 25° C: 3.7 欧姆 @ 80mA,4V
闸电荷(Qg) @ Vgs: 1.58nC @ 10V
输入电容 (Ciss) @ Vds: 7pF @ 10V
功率 - 最大: 250mW
安装类型: 表面贴装
封装/外壳: TO-236-3,SC-59,SOT-23-3
供应商设备封装: 3-CP
包装: 带卷 (TR)
3LN01C
Electrical Characteristics at Ta=25°C
Parameter
Symbol
Conditions
min
Ratings
typ
max
Unit
Drain to Source Breakdown Voltage
Zero-Gate Voltage Drain Current
Gate to Source Leakage Current
V(BR)DSS
IDSS
IGSS
ID=1mA, VGS=0V
VDS=30V, VGS=0V
VGS=±8V, VDS=0V
30
1
±10
V
μ A
μ A
Cutoff Voltage
Forward Transfer Admittance
VGS(off)
| yfs |
RDS(on)1
VDS=10V, ID=100 μ A
VDS=10V, ID=80mA
ID=80mA, VGS=4V
0.4
0.15
0.22
2.9
1.3
3.7
V
S
Ω
Static Drain to Source On-State Resistance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-ON Delay Time
Rise Time
Turn-OFF Delay Time
Fall Time
Total Gate Charge
Gate to Source Charge
Gate to Drain “Miller” Charge
Diode Forward Voltage
RDS(on)2
RDS(on)3
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
VSD
ID=40mA, VGS=2.5V
ID=10mA, VGS=1.5V
VDS=10V, f=1MHz
See speci ? ed Test Circuit.
VDS=10V, VGS=10V, ID=150mA
IS=150mA, VGS=0V
3.7
6.4
7.0
5.9
2.3
19
65
155
120
1.58
0.26
0.31
0.87
5.2
12.8
1.2
Ω
Ω
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
V
Switching Time Test Circuit
4V
0V
VIN
VIN
VDD=15V
ID=80mA
RL=187.5 Ω
PW=10 μ s
D.C. ≤ 1%
D
VOUT
G
3LN01C
P.G
50 Ω
S
No.6260-2/6
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