参数资料
型号: 4460-TCE10D434-EK
厂商: Silicon Laboratories Inc
文件页数: 14/56页
文件大小: 0K
描述: KIT EZRADIO TEST CARD SI4460 TX
设计资源: 4460-TCE10D434 BOM
4460-TCE10D434 PCB
4460-TCE10D434 SCH
标准包装: 1
系列: EZRadioPRO®
类型: 收发器,ISM
频率: 434MHz
适用于相关产品: Si4460
已供物品:
Si4464/63/61/60
1.1. Definition of Test Conditions
Production Test Conditions:
?? T A
= +25 °C.
?? V DD
= +3.3 VDC.
?? TX
output power measured at 915 MHz.
?? External reference signal (XOUT) = 1.0 V PP at 30 MHz, centered around 0.8 VDC.
?? Production
test schematic (unless noted otherwise).
?? All
TX output levels are referred to the pins of the Si4464/63/61/60 (not the output of the RF module).
?? All RX input levels are referred to the input of a tuned balun connected to the RX input pins of the
Si4464/63/61/60.
Qualification Test Conditions:
?? T A
= –40 to +85 °C (Typical T A = 25 °C).
?? V DD
= +1.8 to +3.6 VDC (Typical V DD = 3.3 VDC).
?? Using
TX/RX Split Antenna reference design or production test schematic.
14
?? All
RF input and output levels referred to the pins of the Si4464/63/61/60 (not the RF module).
Rev 1.2
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