- 您现在的位置：买卖IC网 > PDF目录164964 > A1361LKTTN-T MAGNETIC FIELD SENSOR-HALL EFFECT, 4.65-4.80V, RECTANGULAR, THROUGH HOLE MOUNT PDF资料下载
参数资料
| 型号： | A1361LKTTN-T |
| 元件分类： | 磁阻传感器 |
| 英文描述： | MAGNETIC FIELD SENSOR-HALL EFFECT, 4.65-4.80V, RECTANGULAR, THROUGH HOLE MOUNT |
| 封装： | LEAD FREE, PLASTIC, SIP-4 |
| 文件页数： | 10/25页 |
| 文件大小： | 615K |
| 代理商： | A1361LKTTN-T |
A1360, A1361,
and A1362
Hold Mode
Hold mode allows multiple programmable parameters to be
tested simultaneously without permanently setting any values.
With the 136x programming logic, only two parameters located
in different zones can be addressed together. For example, only
the sensitivity and fine quiescent voltage offset parameters can be
temporarily set and tested simultaneously without permanently
setting their values. For unidirectional devices, the unidirectional
bit must be permanently blown before using the Hold Mode to
temporarily set and test the sensitivity and fine quiescent voltage
offset.
Powering the VCC supply automatically causes the device to
enter the first zone. Applying a high pulse, mid pulse, high pulse
sequence selects the Sensitivity register. The sensitivity can be set
to the desired value by applying the appropriate code pulses.
The next high-level pulse transitions the programming logic into
the second zone. Applying one mid level pulse causes the logic
to enter the Fine Quiescent Voltage Output register, and another
high-level pulse causes the logic to enter the Fine Quiescent
Voltage Output bit field. The fine quiescent voltage output can
be set to the desired level by applying the appropriate number of
mid-level pulses to the VOUT pin. (See figure 4.)
The addressed parameter values will be stored in the device logic
even after the programming drive voltage is removed from the
VOUT pin, allowing the output to be measured at any time dur-
ing the programming process.
Figure 4. Hold sequence for testing Sens and VOUT(Q) parameters
together.
After addressing and measuring the device output, cycle the sup-
ply to reset all of the register values. Registers can be addressed
and re-addressed an indefinite number of times. Once the final
desired code is found for each register, cycle the supply and blow
the bit field using Blow mode.
Note: For accurate time measurements, the blow capacitor,
CBLOW, should be removed during output voltage measurement.
Also note that both the Sensitivity and Fine Quiescent Voltage
Output registers should not be blown simultaneously. See the
Blow Mode section for additional information.
Try Mode
Try mode allows a single programmable parameter to be tested
without permanently setting its value. Try mode is a required step
of parameter blowing. (See the Blow Mode section for additional
information.) To select a parameter register in the first zone,
power the supply and enter the appropriate key-code pulse com-
bination (see figure 5). To select a parameter register in the sec-
ond zone, power the supply and apply two high voltage pulses,
followed by the appropriate key-code pulse combination (see
Figure 6). When addressing the bit field, each VPM pulse incre-
ments the value of the parameter register, up to the maximum
possible code (see the Programming Logic table). The addressed
parameter value is stored in the device even after the program-
ming drive voltage is removed from the VOUT pin, allowing its
value to be measured.
Note: For accurate time measurements, the blow capacitor,
CBLOW, should be removed during output voltage measurement.
To reset the bit field, and thus the value of the programmable
parameter, cycle the VCC supply voltage.
Figure 5. Pulses to enter Try mode, zone 1. Example shown is for
addressing the Sensitivity register. After addressing desired code,
cycle the supply to reset the bit field or apply a blow pulse to make the
parameter value permanent.
Programming Modes
Low-Noise Programmable Linear Hall Effect Sensor ICs with
Adjustable Bandwidth (50 kHz Maximum) and Analog Output
18
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
相关PDF资料 |
PDF描述 |
|---|---|
| A150N50X4A | 0 MHz - 2700 MHz 50 ohm RF/MICROWAVE TERMINATION |
| A15QS1-2 | FAST BLOW ELECTRIC FUSE, 1A, 150VAC, 150VDC, 100000A (IR), INLINE/HOLDER |
| A15QS10-2 | FAST BLOW ELECTRIC FUSE, 10A, 150VAC, 150VDC, 100000A (IR), INLINE/HOLDER |
| A15QS100-4TI | FAST BLOW ELECTRIC FUSE, 100A, 150VAC, 150VDC, 100000A (IR), INLINE/HOLDER |
| A15QS100-4 | FAST BLOW ELECTRIC FUSE, 100A, 150VAC, 150VDC, 100000A (IR), INLINE/HOLDER |
相关代理商/技术参数 |
参数描述 |
|---|---|
| A1362LKTTN-T | 功能描述:IC HALL EFFECT SENSOR LN 4-SIP RoHS:是 类别:传感器，转换器 >> 磁性 - 霍尔效应，数字式开关，线性，罗盘 (IC) 系列:- 标准包装:1 系列:- 传感范围:20mT ~ 80mT 类型:旋转 电源电压:4.5 V ~ 5.5 V 电流 - 电源:15mA 电流 - 输出（最大）:- 输出类型:数字式，PWM，8.5 位串行 特点:可编程 工作温度:-40°C ~ 150°C 封装/外壳:20-SSOP（0.209"，5.30mm 宽） 供应商设备封装:20-SSOP 包装:Digi-Reel® 其它名称:AS5132-HSST-500DKR |
| A1363LKTTN-10-T | 功能描述:IC HALL SENSOR 6.4-14MV/G 4SIP 制造商:allegro microsystems, llc 系列:- 包装:剪切带（CT） 零件状态:有效 类型:线性 技术:霍尔效应 轴:单路 感应范围:- 电压 - 电源:4.5 V ~ 5.5 V 电流 - 电源（最大值）:15mA 电流 - 输出（最大值）:10mA 输出类型:模拟电压 分辨率:- 带宽:120kHz 工作温度:-40°C ~ 150°C（TA） 特性:可编程，温度补偿 封装/外壳:4-SIP 模块 供应商器件封装:4-SIP 标准包装:1 |
| A1363LKTTN-1-T | 功能描述:IC HALL SENSOR 0.6-1.3MV/G 4SIP 制造商:allegro microsystems, llc 系列:- 包装:剪切带（CT） 零件状态:有效 类型:线性 技术:霍尔效应 轴:单路 感应范围:- 电压 - 电源:4.5 V ~ 5.5 V 电流 - 电源（最大值）:15mA 电流 - 输出（最大值）:10mA 输出类型:模拟电压 分辨率:- 带宽:120kHz 工作温度:-40°C ~ 150°C（TA） 特性:可编程，温度补偿 封装/外壳:4-SIP 模块 供应商器件封装:模块 标准包装:1 |
| A1363LKTTN-2-T | 功能描述:IC HALL SENSOR 1.3-2.9MV/G 4SIP 制造商:allegro microsystems, llc 系列:- 包装:剪切带（CT） 零件状态:有效 类型:线性 技术:霍尔效应 轴:单路 感应范围:- 电压 - 电源:4.5 V ~ 5.5 V 电流 - 电源（最大值）:15mA 电流 - 输出（最大值）:10mA 输出类型:模拟电压 分辨率:- 带宽:120kHz 工作温度:-40°C ~ 150°C（TA） 特性:可编程，温度补偿 封装/外壳:4-SIP 模块 供应商器件封装:4-SIP 标准包装:1 |
| A1363LKTTN-5-T | 功能描述:IC HALL SENSOR 2.9-6.4MV/G 4SIP 制造商:allegro microsystems, llc 系列:- 包装:剪切带（CT） 零件状态:有效 类型:线性 技术:霍尔效应 轴:单路 感应范围:- 电压 - 电源:4.5 V ~ 5.5 V 电流 - 电源（最大值）:15mA 电流 - 输出（最大值）:10mA 输出类型:模拟电压 分辨率:- 带宽:120kHz 工作温度:-40°C ~ 150°C（TA） 特性:可编程，温度补偿 封装/外壳:4-SIP 模块 供应商器件封装:4-SIP 标准包装:1 |
发布紧急采购，3分钟左右您将得到回复。