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参数资料
| 型号： | DS2172T/T&R |
| 厂商： | Maxim Integrated Products |
| 文件页数： | 1/22页 |
| 文件大小： | 0K |
| 描述： | IC TESTER BIT ERROR RATE 32-TQFP |
| 产品培训模块： | Lead (SnPb) Finish for COTS |
| 产品变化通告： | Product Discontinuation 20/Feb/2012 |
| 标准包装： | 250 |
| 功能： | 位误码率测试器（BERT） |
| 接口： | T1 |
| 电路数： | 1 |
| 电源电压： | 4.5 V ~ 5.5 V |
| 电流 - 电源： | 10mA |
| 工作温度： | 0°C ~ 70°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 32-TQFP |
| 供应商设备封装： | 32-TQFP（7x7） |
| 包装： | 带卷 (TR) |
| 包括： | 错误计数器，样式发生器和检测器 |
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101000
FEATURES
Generates/Detects digital bit patterns for
analyzing, evaluating and troubleshooting
digital communications systems
Operates at speeds from DC to 52 MHz
Programmable
polynomial
length
and
feedback taps for generation of any other
pseudorandom pattern up to 32 bits in length
including: 2
6-1, 29-1, 211-1, 215-1, 220-1, 223-1,
and 2
32-1
Programmable
user-defined
pattern
and
length for generation of any repetitive pattern
up to 32 bits in length
Large 32-bit error count and bit count
registers
Software programmable bit error insertion
Fully
independent
transmit
and
receive
sections
8-bit parallel control port
Detects test patterns with bit error rates up to
10
-2
PIN ASSIGNMENT
ORDERING INFORMATION
DS2172T (0
0 C to 700 C)
DS2172TN (-40
0 C to + 850 C)
DESCRIPTION
The DS2172 Bit Error Rate Tester (BERT) is a software programmable test pattern generator, receiver,
and analyzer capable of meeting the most stringent error performance requirements of digital
transmission facilities.
Two categories of test pattern generation (Pseudo-random and Repetitive)
conform to CCITT/ITU O.151, O.152, O.153, and O.161 standards. The DS2172 operates at clock rates
ranging from DC to 52 MHz. This wide range of operating frequency allows the DS2172 to be used in
existing and future test equipment, transmission facilities, switching equipment, multiplexers, DACs,
Routers, Bridges, CSUs, DSUs, and CPE equipment.
The DS2172 user-programmable pattern registers provide the unique ability to generate loopback patterns
required for T1, Fractional-T1, Smart Jack, and other test procedures. Hence the DS2172 can initiate the
loopback, run the test, check for errors, and finally deactivate the loopback.
The DS2172 consists of four functional blocks: the pattern generator, pattern detector, error counter, and
control interface. The DS2172 can be programmed to generate any pseudorandom pattern with length up
to 2
32-1 bits (see Table 5, Note 9) or any user programmable bit pattern from 1 to 32 bits in length. Logic
inputs can be used to configure the DS2172 for applications requiring gap clocking such as Fractional-T1,
Switched-56, DDS, normal framing requirements, and per-channel test procedures. In addition, the
DS2172 can insert single or 10
-1 to 10-7 bit errors to verify equipment operation and connectivity.
DS2172
Bit Error Rate Tester (BERT)
www.dalsemi.com
TL
AD0
AD1
TEST
VSS
AD2
AD3
AD4
24
23
22
21
20
19
18
17
1
2
3
4
5
6
7
8
RL
RLOS
LC
VSS
VDD
INT
WR(R/W)
ALE(AS)
AD
5
AD
6
AD
7
VS
S
VD
D
BTS
RD(DS
)
CS
TD
ATA
TD
IS
TC
LK
VS
S
VD
D
RCLK
RDI
S
RDA
T
A
DS2172
32-PIN TQFP
9 10 11 12 13 14 15 16
32 31 30 29 28 27 26 25
相关PDF资料 |
PDF描述 |
|---|---|
| DS2174QN+ | IC BERT ENHANCED 44-PLCC |
| DS2175SN+ | IC ELASTIC STORE T1/CEPT 16-SOIC |
| DS2176QN | IC BUFFER RECEIVE T1 IND 28-PLCC |
| DS2180AQN+T&R | IC TRANSCEIVER T1 44-PLCC |
| DS2181AQN+ | IC TXRX CEPT PRIMARY RATE 44PLCC |
相关代理商/技术参数 |
参数描述 |
|---|---|
| DS2174 | 制造商:MAXIM 制造商全称:Maxim Integrated Products 功能描述:EBERT |
| DS2174DK | 制造商:未知厂家 制造商全称:未知厂家 功能描述:Enhanced Bit Error-Rate Tester Design Kit |
| DS2174Q | 功能描述:电信集成电路 Enhanced Bit Error Rate Tester (BERT) RoHS:否 制造商:STMicroelectronics 类型:Telecom IC - Various 工作电源电压:4.75 V to 5.25 V 电源电流: 工作温度范围:- 40 C to + 85 C 安装风格:SMD/SMT 封装 / 箱体:PQFP-100 封装:Tray |
| DS2174Q/T&R+ | 制造商:Maxim Integrated Products 功能描述:BIT ERROR RATE TESTER 44PLCC - Tape and Reel |
| DS2174Q/T&R | 功能描述:电信集成电路 RoHS:否 制造商:STMicroelectronics 类型:Telecom IC - Various 工作电源电压:4.75 V to 5.25 V 电源电流: 工作温度范围:- 40 C to + 85 C 安装风格:SMD/SMT 封装 / 箱体:PQFP-100 封装:Tray |
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