参数资料
型号: DSP56855BUE
厂商: Freescale Semiconductor
文件页数: 9/52页
文件大小: 0K
描述: IC DSP 16BIT 120MHZ 100-LQFP
标准包装: 90
系列: 568xx
核心处理器: 56800E
芯体尺寸: 16-位
速度: 120MHz
连通性: EBI/EMI,SCI,SSI
外围设备: DMA,POR,WDT
输入/输出数: 18
程序存储器容量: 48KB(24K x 16)
程序存储器类型: SRAM
RAM 容量: 24K x 16
电压 - 电源 (Vcc/Vdd): 1.62 V ~ 1.98 V
振荡器型: 外部
工作温度: -40°C ~ 85°C
封装/外壳: 100-LQFP
包装: 托盘
General Characteristics
56855 Technical Data, Rev. 6
Freescale Semiconductor
17
Part 4 Specifications
4.1 General Characteristics
The 56855 is fabricated in high-density CMOS with 5-volt tolerant TTL-compatible digital inputs. The
term “5-volt tolerant” refers to the capability of an I/O pin, built on a 3.3V compatible process
technology, to withstand a voltage up to 5.5V without damaging the device. Many systems have a
mixture of devices designed for 3.3V and 5V power supplies. In such systems, a bus may carry both 3.3V
and 5V- compatible I/O voltage levels (a standard 3.3V I/O is designed to receive a maximum voltage of
3.3V
± 10% during normal operation without causing damage). This 5V tolerant capability therefore
offers the power savings of 3.3V I/O levels while being able to receive 5V levels without being damaged.
Absolute maximum ratings given in Table 4-1 are stress ratings only, and functional operation at the
maximum is not guaranteed. Stress beyond these ratings may affect device reliability or cause permanent
damage to the device.
The 56855 DC/AC electrical specifications are preliminary and are from design simulations. These
specifications may not be fully tested or guaranteed at this early stage of the product life cycle. Finalized
41
TMS
Input
Test Mode Select Input (TMS)—This input pin is used to sequence the
JTAG TAP controller’s state machine. It is sampled on the rising edge of
TCK and has an on-chip pull-up resistor.
Note:
Always tie the TMS pin to VDD through a 2.2K resistor.
38
TRST
Input
Test Reset (TRST)—As an input, a low signal on this pin provides a reset
signal to the JTAG TAP controller. To ensure complete hardware reset,
TRST should be asserted whenever RESET is asserted. The only
exception occurs in a debugging environment, since the Enhanced
OnCE/JTAG module is under the control of the debugger. In this case it is
not necessary to assert TRST when asserting RESET. Outside of a
debugging environment RESET should be permanently asserted by
grounding the signal, thus disabling the Enhanced OnCE/JTAG module on
the device.
Note:
For normal operation, connect TRST directly to VSS. If the design is to be
used in a debugging environment, TRST may be tied to VSS through a 1K resistor.
37
DE
Input/Output
Debug Event (DE)—This is an open-drain, bidirectional, active low signal.
As an input, it is a means of entering debug mode of operation from an
external command controller. As an output, it is a means of acknowledging
that the chip has entered debug mode.
This pin is connected internally to a weak pull-up resistor.
Table 3-1. 56855 Signal and Package Information for the 100-pin LQFP (Continued)
Pin No.
Signal Name
Type
Description
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