参数资料
型号: EP20K300EQC240-3
厂商: Altera
文件页数: 69/117页
文件大小: 0K
描述: IC APEX 20KE FPGA 300K 240-PQFP
产品培训模块: Three Reasons to Use FPGA's in Industrial Designs
标准包装: 24
系列: APEX-20K®
LAB/CLB数: 1152
逻辑元件/单元数: 11520
RAM 位总计: 147456
输入/输出数: 152
门数: 728000
电源电压: 1.71 V ~ 1.89 V
安装类型: 表面贴装
工作温度: 0°C ~ 85°C
封装/外壳: 240-BFQFP
供应商设备封装: 240-PQFP(32x32)
Altera Corporation
55
APEX 20K Programmable Logic Device Family Data Sheet
IEEE Std.
1149.1 (JTAG)
Boundary-Scan
Support
All APEX 20K devices provide JTAG BST circuitry that complies with the
IEEE Std. 1149.1-1990 specification. JTAG boundary-scan testing can be
performed before or after configuration, but not during configuration.
APEX 20K devices can also use the JTAG port for configuration with the
Quartus II software or with hardware using either Jam Files (.jam) or Jam
Byte-Code Files (.jbc). Finally, APEX 20K devices use the JTAG port to
monitor the logic operation of the device with the SignalTap embedded
logic analyzer. APEX 20K devices support the JTAG instructions shown in
Table 19. Although EP20K1500E devices support the JTAG BYPASS and
SignalTap instructions, they do not support boundary-scan testing or the
use of the JTAG port for configuration.
Note to Table 19:
(1)
The EP20K1500E device supports the JTAG BYPASS instruction and the SignalTap instructions.
Table 19. APEX 20K JTAG Instructions
JTAG Instruction
Description
SAMPLE/PRELOAD
Allows a snapshot of signals at the device pins to be captured and examined during
normal device operation, and permits an initial data pattern to be output at the device
pins. Also used by the SignalTap embedded logic analyzer.
EXTEST
Allows the external circuitry and board-level interconnections to be tested by forcing a
test pattern at the output pins and capturing test results at the input pins.
BYPASS (1)
Places the 1-bit bypass register between the TDI and TDO pins, which allows the BST
data to pass synchronously through selected devices to adjacent devices during
normal device operation.
USERCODE
Selects the 32-bit USERCODE register and places it between the TDI and TDO pins,
allowing the USERCODE to be serially shifted out of TDO.
IDCODE
Selects the IDCODE register and places it between TDI and TDO, allowing the
IDCODE to be serially shifted out of TDO.
ICR Instructions
Used when configuring an APEX 20K device via the JTAG port with a MasterBlasterTM
or ByteBlasterMVTM download cable, or when using a Jam File or Jam Byte-Code File
via an embedded processor.
SignalTap Instructions
Monitors internal device operation with the SignalTap embedded logic analyzer.
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