参数资料
型号: FQB30N06LTM
厂商: Fairchild Semiconductor
文件页数: 4/8页
文件大小: 0K
描述: MOSFET N-CH 60V 32A D2PAK
产品培训模块: High Voltage Switches for Power Processing
标准包装: 1
系列: QFET™
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 逻辑电平门
漏极至源极电压(Vdss): 60V
电流 - 连续漏极(Id) @ 25° C: 32A
开态Rds(最大)@ Id, Vgs @ 25° C: 35 毫欧 @ 16A,10V
Id 时的 Vgs(th)(最大): 2.5V @ 250µA
闸电荷(Qg) @ Vgs: 20nC @ 5V
输入电容 (Ciss) @ Vds: 1040pF @ 25V
功率 - 最大: 3.75W
安装类型: 表面贴装
封装/外壳: TO-263-3,D²Pak(2 引线+接片),TO-263AB
供应商设备封装: TO-263(D2Pak)
包装: 标准包装
其它名称: FQB30N06LTMDKR
Typical Characteristics
1.2
1.1
(Continued)
2.5
2.0
1.5
1.0
1.0
0.9
※ Notes :
1. V GS = 0 V
2. I D = 250 μ A
0.5
※ Notes :
1. V GS = 10 V
2. I D = 16 A
0.8
-100
-50
0
50
100
150
200
0.0
-100
-50
0
50
100
150
200
T J , Junction Temperature [ C]
T J , Junction Temperature [ C]
o
Figure 7. Breakdown Voltage Variation
vs. Temperature
Operation in This Area
is Limited by R DS(on)
40
o
Figure 8. On-Resistance Variation
vs. Temperature
10
2
100 μ s
30
1 ms
DC
10 ms
20
10
1
1. T C = 25 C
2. T J = 175 C
※ Notes :
o
o
3. Single Pulse
10
10
10
0
10
-1
10
0
1
10
2
0
25
50
75
100
125
150
175
V DS , Drain-Source Voltage [V]
Figure 9. Maximum Safe Operating Area
T C , Case Temperature [ ℃ ]
Figure 10. Maximum Drain Current
vs Case Temperature
10
0
D = 0 .5
10
-1
0 .2
0 .1
0 .0 5
※ N otes :
1 . Z θ J C ( t ) = 1 . 9 0 ℃ /W M a x .
2 . D u t y F a c t o r , D = t 1 /t 2
3 . T J M - T C = P D M * Z θ J C ( t )
0 .0 2
0 .0 1
s in g le p u ls e
P DM
t 1
t 2
10
-2
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
t 1 , S q u a r e W a v e P u ls e D u r a tio n [s e c ]
Figure 11. Transient Thermal Response Curve
? 2000 Fairchild Semiconductor Corporation
FQB30N06L Rev. C 1
4
www.fairchildsemi.com
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