
MCF52259 ColdFire Microcontroller, Rev. 5
Electrical Characteristics
Freescale
31
2.8
Clock Source Electrical Specifications
Table 14. Oscillator and PLL Specifications
(VDD and VDDPLL = 3.0 to 3.6 V, VSS = VSSPLL = 0 V)
Characteristic
Symbol
Min
Max
Unit
Clock Source Frequency Range of EXTAL Frequency Range
Crystal
External1
1 In external clock mode, it is possible to run the chip directly from an external clock source without enabling the PLL.
fcrystal
fext
12
0
66.67 or 80
2 This value has been updated.
MHz
PLL reference frequency range
fref_pll
210.0
MHz
System frequency 3
External clock mode
On-chip PLL frequency
3 All internal registers retain data at 0 Hz.
fsys
0
fref / 32
4 Depending on packaging; see the orderable part number summary (Table 2). MHz
Loss of reference frequency 5, 7 5 Loss of Reference Frequency is the reference frequency detected internally, which transitions the PLL into self clocked mode.
fLOR
100
1000
kHz
Self clocked mode frequency 6
6 Self clocked mode frequency is the frequency at which the PLL operates when the reference frequency falls below f
LOR with
default MFD/RFD settings.
fSCM
15
MHz
Crystal start-up time 7, 8
7 This parameter is characterized before qualification rather than 100% tested.
8 Proper PC board layout procedures must be followed to achieve specifications.
tcst
—0.1
ms
EXTAL input high voltage
External reference
VIHEXT
2.0
V
EXTAL input low voltage
External reference
VILEXT
VSS
0.8
V
PLL lock time4,9
9 This specification applies to the period required for the PLL to relock after changing the MFD frequency control bits in the
synthesizer control register (SYNCR).
tlpll
—500
s
Duty cycle of reference 4
tdc
40
60
% fref
Frequency un-LOCK range
fUL
–1.5
1.5
% fref
Frequency LOCK range
fLCK
–0.75
0.75
% fref
CLKOUT period jitter 4, 5, 10 ,11, measured at fSYS Max
Peak-to-peak (clock edge to clock edge)
Long term (averaged over 2 ms interval)
10 Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
sys.
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the PLL circuitry via VDDPLL and VSSPLL and variation in crystal oscillator frequency increase the Cjitter percentage
for a given interval.
11 Based on slow system clock of 40 MHz measured at f
sys max.
Cjitter
—
10
.01
% fsys
On-chip oscillator frequency
foco
7.84
8.16
MHz