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参数资料
| 型号： | HFA3860BIV |
| 厂商： | HARRIS SEMICONDUCTOR |
| 元件分类： | 无绳电话/电话 |
| 英文描述： | 3.3V 288-mc CPLD |
| 中文描述： | TELECOM, CELLULAR, BASEBAND CIRCUIT, PQFP48 |
| 文件页数： | 11/40页 |
| 文件大小： | 272K |
| 代理商： | HFA3860BIV |
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4-11
Definitions
ED.
Energy Detect, indicates that the RSSI value exceeds its
programmed threshold.
CRS.
Carrier Sense, indicates that a signal has been
acquired (PN acquisition).
TXCLK.
Transmit clock.
Track.
Indicates start of tracking and start of SFD time-out.
SFD Detect.
Variable time after track starts.
Signal Field Ready.
~ 8
μ
s after SFD detect.
Length Field Ready.
~ 32
μ
s after SFD detect.
Header CRC Valid.
~ 48
μ
s after SFD detect.
DCLK.
Data bit clock.
FrqReg.
Contents of the NCO frequency register.
PhaseReg.
Phase of signal after carrier loop correction.
NCO PhaseAccumReg.
Contents of the NCO phase
accumulation register.
SQ1.
Signal Quality measure #1. Contents of the bit sync
accumulator. Eight MSBs of most recent 16-bit stored value.
SQ2.
Signal Quality measure #2. Signal phase variance
after removal of data. Eight MSBs of most recent 16-bit
stored value.
Sample CLK.
Receive clock (RX sample clock). Nominally
22MHz.
Subsample CLK.
LO rate symbol clock. Nominally 1MHz.
BitSyncAccum.
Real time monitor of the bit synchronization
accumulator contents, mantissa only.
A/D_Cal_ck.
Clock for applying A/D calibration corrections.
A/DCal.
5-bit value that drives the D/A adjusting the A/D
reference.
11
Reserved
Reserved
Factory Test Only
12
A/D Cal Test
Mode
A/D Cal CLK
A/DCal, ED, A/DCal
Disable, ADCal (4:0)
13
Correlator I High
Rate
Sample CLK
Correlator I (8:1)/
CCK Magnitude
14
Correlator Q
High Rate
Sample CLK
Correlator Q
(8:1)/CCK Quality
15
Chip Error
Accumulator
0
Chip Error Accum
(14:7)
16
NCO Test Hi
Rate
Sample CLK
NCO Accum (19:12)
17
Freq Test Hi
Rate
Sample CLK
Lag Accum (18:11)
18
Carrier Phase
Error Hi Rate
Sample CLK
Carrier Phase Error
(6,6:0)
19
Reserved
Sample CLK
Factory Test Only
20
Reserved
Sample CLK
Factory Test Only
21
I_A/D, Q_A/D
Sample CLK
0,0,I_A/D(2:0),Q_A/D
(2:0)
22
Reserved
Reserved
Factory Test Only
23
Reserved
Reserved
Factory Test Only
24
Reserved
Reserved
Factory Test Only
25
A/D Cal Accum
Lo
A/D Cal
Accum (8)
A/D Cal Accum (7:0)
26
A/D Cal Accum
Hi
A/D Cal
Accum (17)
A/D Cal Accum (16:9)
27
Freq Accum Lo
Freq Accum
(15)
Freq Accum (14:7)
28
Reserved
Reserved
Factory Test Only
29
SQ2 Monitor Hi
Pulse After
SQ Valid
SQ2 (15:8)
30-31
Reserved
Reserved
Factory Test Only
TABLE 5. TEST MODES (Continued)
MODE
DESCRIPTION
TEST_CLK
TEST (7:0)
TABLE 6. POWER DOWN MODES
MODE
RX_PE
TX_PE
RESET
AT 44MHz
DEVICE STATE
SLEEP
Inactive
Inactive
Active
600
μ
A
Both transmit and receive functions disabled. Device in sleep mode. Control
Interface is still active. Register values are maintained. Device will return to its
active state within 10
μ
s plus settling time of AC coupling capacitors (about
5ms).
STANDBY
Inactive
Inactive
Inactive
7mA
Both transmit and receive operations disabled. Device will resume its
operational state within 1
μ
s of RX_PE or TX_PE going active.
TX
Inactive
Active
Inactive
10mA
Receiver operations disabled. Receiver will return in its operational state
within 1
μ
s of RX_PE going active.
RX
Active
Inactive
Inactive
29mA
Transmitter operations disabled. Transmitter will return to its operational state
within 2 MCLKs of TX_PE going active.
NO CLOCK
I
CC
Standby
Active
300
μ
A
All inputs at V
CC
or GND.
HFA3860B
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相关代理商/技术参数 |
参数描述 |
|---|---|
| HFA3860BIV WAF | 制造商:Harris Corporation 功能描述: |
| HFA3860BIV96 | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| HFA3860IV | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Harris Corporation 功能描述: |
| HFA3860IV WAF | 制造商:Harris Corporation 功能描述: |
| HFA3860IV96 | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:11 Mbps Direct Sequence Spread Spectrum Baseband Processor |
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