参数资料
| 型号： | HI5805BIB |
| 厂商： | Intersil |
| 文件页数： | 4/12页 |
| 文件大小： | 0K |
| 描述： | IC ADC 12-BIT 5MSPS 28-SOIC |
| 标准包装： | 26 |
| 位数： | 12 |
| 采样率（每秒）： | 5M |
| 数据接口： | 并联 |
| 转换器数目： | 3 |
| 功率耗散（最大）： | 350mW |
| 电压电源： | 模拟和数字 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 28-SOIC（0.295"，7.50mm 宽） |
| 供应商设备封装： | 28-SOIC W |
| 包装： | 管件 |
| 输入数目和类型： | 2 个单端，单极；1 个差分，双极 |
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Transient Response
Transient response is measured by providing a full-scale
transition to the analog input of the ADC and measuring the
number of cycles it takes for the output code to settle within
12-bit accuracy.
Over-Voltage Recovery
Over-voltage Recovery is measured by providing a full-scale
transition to the analog input of the ADC which overdrives
the input by 200mV, and measuring the number of cycles it
takes for the output code to settle within 12-bit accuracy.
Full Power Input Bandwidth (FPBW)
Full power input bandwidth is the analog input frequency at
which the amplitude of the digitally reconstructed output has
decreased 3dB below the amplitude of the input sinewave.
The input sinewave has an amplitude which swings from -fS
to +fS. The bandwidth given is measured at the specified
sampling frequency.
Timing Definitions
Refer to Figure 1, Internal Circuit Timing, and Figure 2,
Input-To-Output Timing, for these definitions.
Aperture Delay (tAP)
Aperture delay is the time delay between the external
sample command (the falling edge of the clock) and the time
at which the signal is actually sampled. This delay is due to
internal clock path propagation delays.
Aperture Jitter (tAJ)
Aperture Jitter is the RMS variation in the aperture delay due
to variation of internal clock path delays.
Data Hold Time (tH)
Data hold time is the time to where the previous data (N - 1)
is no longer valid.
Data Output Delay Time (tOD)
Data output delay time is the time to where the new data (N)
is valid.
Data Latency (tLAT)
After the analog sample is taken, the digital data is output on
the bus at the third cycle of the clock. This is due to the
pipeline nature of the converter where the data has to ripple
through the stages. This delay is specified as the data
latency. After the data latency time, the data representing
each succeeding sample is output at the following clock
pulse. The digital data lags the analog input sample by 3
clock cycles.
HI5805
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相关代理商/技术参数 |
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| HI5805BIBZ | 功能描述:模数转换器 - ADC 28 INDTEMP A/D 12BIT 5MSPS 0 5LSB V-REF RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
| HI5805EVAL1 | 功能描述:数据转换 IC 开发工具 HI5805 EVAL PL ATFORM RoHS:否 制造商:Texas Instruments 产品:Demonstration Kits 类型:ADC 工具用于评估:ADS130E08 接口类型:SPI 工作电源电压:- 6 V to + 6 V |
| HI5806IB | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| HI5808 | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:12-Bit, 9MSPS A/D Converter |
| HI5808_01 | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:12-Bit, 9MSPS A/D Converter |
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