参数资料
型号: IDT70V9369L7PFI
厂商: IDT, Integrated Device Technology Inc
文件页数: 8/16页
文件大小: 0K
描述: IC SRAM 288KBIT 7NS 100TQFP
标准包装: 90
格式 - 存储器: RAM
存储器类型: SRAM - 双端口,同步
存储容量: 288K(16K x 18)
速度: 7ns
接口: 并联
电源电压: 3 V ~ 3.6 V
工作温度: -40°C ~ 85°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
包装: 托盘
其它名称: 70V9369L7PFI
IDT70V9369L
High-Speed 3.3V 16K x 18 Dual-Port Synchronous Pipelined Static RAM
Industrial and Commercial Temperature Ranges
Timing Waveform of Read Cycle for Flow-Through Output
( FT /PIPE "X" = V IL ) (3,7)
t CYC1
CLK
CE 0
t CH1
t CL1
t SC
t HC
t SC
t HC
CE 1
t SB
t HB
UB , LB
R/ W
t SW t HW
t SA
t HA
t SB
t HB
ADDRESS
(5)
An
t CD1
An + 1
t DC
An + 2
An + 3
t CKHZ (1)
DATA OUT
Qn
Qn + 1
Qn + 2
t CKLZ
(1)
(1)
t OHZ
t OLZ
(1)
t DC
OE
(2)
t OE
Timing Waveform of Read Cycle for Pipelined Operation
( FT /PIPE "X" = V IH ) (3,7)
t CYC2
5648 drw 06
CLK
CE 0
t CH2
t CL2
t SC
t HC
t SC
t HC
(4)
CE 1
UB , LB
R/ W
t SB
t SW
t SA
t HB
t HW
t HA
t SB
(6)
t HB
ADDRESS
(5)
An
An + 1
An + 2
An + 3
(1 Latency)
t CD2
t DC
Qn + 2
DATA OUT
OE
(2)
t CKLZ
(1)
Qn
Qn + 1
t OHZ (1)
t OLZ (1)
(6)
t OE
NOTES:
5648 drw 07
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge.
3. ADS = V IL and CNTRST = V IH .
4. The output is disabled (High-Impedance state) by CE 0 = V IH , CE 1 = V IL , UB = V IH , or LB = V IH following the next rising edge of the clock. Refer to Notes under
Pin Names Table.
5. Addresses do not have to be accessed sequentially since ADS = V IL constantly loads the address on the rising edge of the CLK; numbers
are for reference use only.
6. If UB or LB was HIGH, then the Upper Byte and/or Lower Byte of DATA OUT for Qn + 2 would be disabled (High-Impedance state).
7. "X' here denotes Left or Right port. The diagram is with respect to that port.
8
6.42
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