参数资料
型号: KSZ8695PX-EVAL
厂商: Micrel Inc
文件页数: 30/40页
文件大小: 0K
描述: KIT EVAL KSZ8695PX EXPERIMENT
标准包装: 1
主要目的: 接口,以太网控制器(PHY 和 MAC)
嵌入式:
已用 IC / 零件: KSZ8695PX
主要属性: 单芯片网关解决方案
已供物品:
相关产品: 576-1024-ND - IC SWITCH 10/100 1PORT 289PBGA
其它名称: 576-3876
KSZ8695PX-EVAL-ND
KS8695PX
Micrel
Pin
T17
M17
N17
P17
R17
E15
E14
Name
EROEN/
WRSTPLS
ERWEN0/
TESTACK
ERWEN1/
TESTREQB
ERWEN2/
TESTREQA
ERWEN3/
TICTESTENN
WLED0/
B0SIZE0
WLED1/
B0SIZE1
I/O Type (1)
O/I
O
O
O
O
O/I
O/I
Description
Normal mode: External I/O and ROM/SRAM/FLASH output enable: Active low.
When asserted, this signal controls the output enable port of the speci? ed memory
device.
During reset: Watchdog timer reset polarity setting. WRSTPLS=0, active low;
WRSTPLS = 1, active high. No default.
External I/O and ROM/SRAM/FLASH write byte enable: Active low. When asserted,
the ERWENx controls the byte write enable of the memory device (except SDRAM).
ARM CPU test signal (factory reserved test signal).
External I/O and ROM/SRAM/FLASH write byte enable: Active low. When asserted,
the ERWENx controls the byte write enable of the memory device (except SDRAM).
ARM CPU test signal (factory reserved test signal).
External I/O and ROM/SRAM/FLASH write byte enable: Active low. When asserted,
the ERWENx controls the byte write enable of the memory device except SDRAM).
ARM CPU test signal (factory reserved test signal).
External I/O and ROM/SRAM/FLASH write byte enable. Active low. When asserted,
the ERWENx controls the byte write enable of the memory device (except SDRAM).
ARM CPU test signal (factory reserved test signal).
Normal mode: WAN LED indicator 0: Programmable via WAN misc. Control register
bits [2:0].
000 = Speed; 001 = Link; 010 = Full/half duplex; 011 = Collision;
100 = TX/RX activity; 101 = Full-duplex collision; 110 = Link/Activity.
During reset: Bank 0 data access size. Bank 0 is used for the boot program.
B0SiZE[1:0] are used to specify the size of the bank 0 data bus width as follows:
‘01’ = one byte, ‘10’ = half-word, ‘11’ = one word, and ‘00’ = reserved.
Normal mode: WAN LED indicator 1: Programmable via WAN Misc. Control register
bits [6:4].
000 = Speed; 001 = Link; 010 = Full/half duplex; 011 = Collision;
100 = TX/RX activity; 101 = Full-duplex collision; 110 = Link/Activity.
During reset: Bank 0 data access size. Bank 0 is used for the boot program.
B0SIZE[1:0] are used to specify the size of the bank 0 data bus width as follows:
‘01’ = one byte, ‘10’ = half-word, ‘11’ = one word, and ‘00’ = reserved.
Factory Test Pins
Pin Name
I/O Type (1)
Description
F7
M4
F4
TESTEN
TEST1
TEST2
I
I
I
Factory test signal. Pull-down or direct connect to GND required.
Factory test signal. No connect for normal operation.
Factory test signal. No connect for normal operation.
Note:
1. I = Input.
O = Output.
O/I = Output in normal mode; input pin during reset.
September 2005
30
M9999-091605
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