参数资料
型号: L99PD08
厂商: STMICROELECTRONICS
元件分类: 电源管理
英文描述: POWER SUPPLY MANAGEMENT CKT, PQFP32
封装: ROHS COMPLIANT, LQFP-32
文件页数: 29/41页
文件大小: 750K
代理商: L99PD08
L99PD08
SPI
Doc ID 15872 Rev 3
35/41
Note:
If a digital device and no detailed diagnosis is selected, also ambiguous failures are
reflected in this register (channel is turned off if ASDT is selected).
Note:
1
In digital mode, the OL failure can not be cleared in off-state when detailed diagnosis is
disabled. To clear the OL bit, the detailed diagnosis has to be enabled or the failure has to
be removed and cleared in on-state.
2
If a digital device and no detailed diagnosis is selected, also ambiguous failures are
reflected in this register.
Table 41.
AUX_STATUS Registers, hex2F (RC-Type)
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
-
CS_time50% CS_timeout
-
CLK_IN1
Warm
CLK_IN0
Warm
CLK_IN0 Warn, CLK_IN1 Warn: the corresponding warn bit is set when the input frequency
is below 5kHz (fPWMmin_set = 19 Hz) and reset when the frequency is above 7 kHz
fPWMmin_reset = 28 Hz. The hysteresis was implemented not to get a flickering on the PWM
output. If the warn bit is set the PWM is generated by an internally generated signal
(f = 122 Hz). The warn bit does not set the global error flag.
CLK_INx Warn 0
input clock frequency fCLK_INx > 7 kHz.
1
input clock frequency fCLK_INx < 5 kHz (fPWMmin < 19 Hz). The internal
generated PWM clock signal is used.
CS_timeout
this bit is set when a CS-timeout occurred. It has to be cleared by a clear
command (Op code b10)
CS_time50%
this bit is set when 50% of the CS-timeout time is reached.
Table 42.
OT_FAULT Registers, hex30 (RC-Type)
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
CH7
CH6
CH5
CH4
CH3
CH2
CH1
CH0
CHx
0 on channel CHx wasn’t detected dedicated failure
1 on channel CHx was detected dedicated failure
Table 43.
OL_FAULT Registers, hex31 (RC-Type)
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
Bit 0
CH7
CH6
CH5
CH4
CH3
CH2
CH1
CH0
CHx
0 on channel CHx wasn’t detected dedicated failure
1 on channel CHx was detected dedicated failure
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