参数资料
型号: LM5051MAEVAL/NOPB
厂商: National Semiconductor
文件页数: 5/23页
文件大小: 0K
描述: BOARD EVAL FOR LM5051MA
标准包装: 1
主要目的: 电源管理,O 环控制器/低压侧
嵌入式:
已用 IC / 零件: LM5051
已供物品:
SNVS702D – OCTOBER 2011 – REVISED MARCH 2013
Electrical Characteristics (continued)
Limits in standard type are for T J = 25°C only; limits in boldface type apply over the operating junction temperature (T J )
range of -40°C to +125°C. Minimum and Maximum limits are ensured through test, design, or statistical correlation. Typical
values represent the most likely parametric norm at T J = 25°C, and are provided for reference purposes only. Unless
otherwise stated all conditions and measurements are referenced to device pin 7 (INP/VSS), and the following conditions
apply: V LINE = 48.0V, V INN = -150 mV, V OFF = 0.0V, C GATE = 47 nF, C VCC = 0.1 μF, and T J = 25°C.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
FET Test Comparator
V SD(TST)
FET Test Threshold Voltage
V INP - V INN
V OFF = 5.0V
V INN/VSS going negative from
V INP until nFGD pin goes Hi-Z
-360
-260
-183
mV
V OFF = 5.0V
Δ V SD(TST)
FET Test Threshold Voltage Hysteresis
V INN going positve from
V SDT(ST) until nFGD pin goes
-
6.5
-
mV
Lo-Z
nFGD Pin
nFGD VOL
nFGD IOL
nFGD Output Low Voltage
nFGD Output = On
nFGD Output Leakage Current
nFGD Output = Off
V OFF = 5V
I nFGD = 1mA Sinking
V OFF = 0V
V nFGD = 5.0V
-
-
285
0.01
450
0.7
mV
μA
V SD(REG)
0.0 mV
? V SD(REV)
V SD(REV)
V GATE
0.0V
Figure 4. V SD(REV) Threshold Definitions
0.0 mV
? V SD(TST)
V SD(TST)
V nFGD
0.0V
Figure 5. V SD(TST) Threshold Definitions
Copyright ? 2011–2013, Texas Instruments Incorporated
Product Folder Links: LM5051
5
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