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参数资料
| 型号： | LTC4110EUHF#TRPBF |
| 厂商： | Linear Technology |
| 文件页数： | 6/52页 |
| 文件大小： | 0K |
| 描述： | IC BATTERY BACKUP MANAGER 38-QFN |
| 标准包装： | 2,500 |
| 功能： | 备份管理 |
| 电池化学： | 铅酸，锂离子，锂聚合物，镍镉，镍氢，超级电容器 |
| 电源电压： | 4.5 V ~ 19 V |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 38-WFQFN 裸露焊盘 |
| 供应商设备封装： | 38-QFN（5x7） |
| 包装： | 带卷 (TR) |
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LTC4110
ELECTRICAL CHARACTERISTICS The l denotes the speci?cations which apply over the full operating
temperature range, otherwise speci?cations are at T A = 25°C. Unless otherwise speci?ed, V DCIN = V DCOUT = V DCDIV = 12V, V BAT = 8.4V,
GND = SGND = CLP = CLN = SHDN = 0V and R VREF = 49.9k. All currents into device pins are positive and all currents out of device pins
are negative. All voltages are referenced to GND, unless otherwise speci?ed.
SYMBOL
V REMH
PARAMETER
THB Pin Battery Removal Threshold
CONDITIONS
V THB Decreasing; Lead Acid Only
MIN
TYP
25
MAX
UNITS
mV
Hysteresis Voltage
Logic and Status Output Levels
V ILS
V IHS
SCL/SDA Input Pins Low Voltage
SCL/SDA Input Pins High Voltage
l
l
2.1
0.8
V
V
V OLS
V OLG
SDA Output Pin Low Voltage
ACPb, GPIO1,2,3 Output Pins Low Voltage
I PULL-UP = 350μA
I ACPb , I GPIO1 , I GPIO2 , I GPIO3 = 10mA
l
0.4
1
V
V
I OHG
ACPb, GPIO1,2,3 Output Pins Open
Leakage Current
Outputs Open, V ACPb , V GPIO1,2,3 = 5V
–2
2
μA
V ILG
V IHG
V ILSD
V IHSD
GPIO Input Low Voltage
GPIO Input High Voltage
SHDN Input Pin Low Voltage
SHDN Input Pin High Voltage
l
l
1.5
2.4
1
0.5
V
V
V
V
I ISD
T LR
SHDN Input Pin Pull-Up Current
Logic Reset Duration After Power-Up
V SHDN = 2.4V
V DCIN Transition From 0V to 5V in <1ms;
–3.5
–2
–1
1
μA
s
From Zero
SMBus Timing (Note 9)
V BAT = 0
t HIGH
SCL Serial Clock High Period
I PULL-UP = 350μA, C LOAD = 250pF,
l
4
μs
R PU = 9.31k
t LOW
SCL Serial Clock Low Period
I PULL-UP = 350μA, C LOAD = 250pF,
l
4.7
μs
R PU = 9.31k
t TO
Timeout Period
l
25
ms
t F
t SU-STA
t HD-STA
t HD-DAT
SDA/SCL Fall Time
Start Condition Set-Up Time
Start Condition Hold Time
SDA to SCL Falling-Edge Hold Time,
C LOAD = 250pF, R PU = 9.31k
l
l
l
l
4.7
4
300
300
ns
μs
μs
ns
Slave Clocking in Data
Note 1: Stresses beyond those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to any Absolute
Maximum Rating condition for extended periods may affect device
reliability and lifetime. Speci?c functionality or parametric performance
of the device beyond the limits expressly given in the Electrical
Characteristics table is not implied by these maximum ratings.
Note 2: The LTC4110E is guaranteed to meet performance speci?cations
from 0°C to 85°C. Speci?cations over the –40°C to 85°C operating
temperature range are assured by design, characterization and correlation
with statistical process controls.
Note 3: This IC includes overtemperature protection that is intended
to protect the device during momentary overload conditions.
Overtemperature protection will become active at a junction temperature
greater than the maximum operating junction temperature. Continuous
operation above the speci?ed maximum operation temperature may result
in device degradation or failure. Operating junction temperature T J (in
°C) is calculated from the ambient temperature T A and the average power
dissipation P D (in watts) by the formula T J = T A + θ JA ? P D .
Note 4: The LTC4110 is idle with no application load. It is not charging
or calibrating the battery and is not in backup or shutdown mode. The
internal clock is running and the SMBus is functional.
Note 5: Combined current of CSP, CSN and BAT pins set to V BAT with no
application load.
Note 6: C TH is de?ned as the sum of capacitance on THA, THB
SafetySignal.
Note 7: Does not include tolerance of current sense or current
programming resistors.
Note 8: Given as a per cell voltage referred to the BAT pin (V BAT /number of
series cells).
Note 9: Refer to System Management Bus Speci?cation, Revision 1.1,
section 2.1 for Timing Diagrams and section 8.1, for t LOW and t TIMEOUT
requirements.
Note 10: Speci?cations over the –5°C to 85°C operating ambient
temperature range are assured by design, characterization and correlation
with statistical process controls.
4110fb
6
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