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| 型号： | M7010R-066ZA1T |
| 厂商： | 意法半导体 |
| 英文描述： | 16K x 68-bit Entry NETWORK SEARCH ENGINE |
| 中文描述： | 16K的× 68位进入网络搜索引擎 |
| 文件页数： | 62/67页 |
| 文件大小： | 449K |
| 代理商： | M7010R-066ZA1T |
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M7010R
62/67
Table 36. Right-Shift of SRAM Signals for TLSZ
Values
Table 37. Right-Shift of SRAM Signals for
HLAT Values
JTAG (1149.1) TESTING
The M7010R supports the Test Access Port (TAP)
and Boundary Scan Architecture as specified in
the IEEE JTAG standard 1149.1. The pin interface
to the chip consists of five signals with the stan-
dard definitions: TCK, TMS, TDI, TDO, and
TRST_L. Table 38, page 62 describes the opera-
tions that the test access port controller supports.
Table 39 shows the TAP Device ID Register.
Note: To disable JTAG functionality, connect the
TCK, TMS, and TDI pins to V
DDQ
through a pull-
up, and the TRST_L to ground through a pull-
down.
Table 38. Test Access Port Controller Instructions
Table 39. TAP Device ID Register
TLSZ
Number of CLK Cycles
00
0
01
1
10
2
HLAT
Number of CLK Cycles
000
0
001
1
010
2
011
3
100
4
101
5
110
6
111
7
Instruction
Type
Description
SAMPLE/PRELOAD
Mandatory
Sample/Preload.
Loads the values of signals going to and from IO
pins into the boundary scan shift register to provide a snapshot of the
normal functional operation.
EXTEST
Mandatory
External Test.
Uses boundary scan values shifted in from TAP to test
connectivity external to the device.
INTEST
Optional
Internal Test.
Allows slow-speed, functional testing of the device
using the boundary scan register to provide the I/O values.
Field
Range
Initial Value
Description
Revision
[31:28]
0001
Revision Number.
This is the current device revision number.
Numbers start from one and increment by one for each revision of the
device.
Part #
[27:12]
0000 0000 0000 0001 This is the part number for this device.
MFID
[11:1]
000_1101_1100
Manufacturer ID.
This field is the same as the manufacturer ID used
in the TAP controller.
LSB
[0:0]
1
Least Significant Bit
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