参数资料
型号: MAX1124EGK+TD
厂商: Maxim Integrated Products
文件页数: 8/17页
文件大小: 0K
描述: IC ADC 10BIT PAR 250MSPS 68QFN
标准包装: 2,500
位数: 10
采样率(每秒): 250M
数据接口: LVDS,并联
转换器数目: 1
功率耗散(最大): 657mW
电压电源: 模拟和数字
工作温度: -40°C ~ 85°C
安装类型: *
封装/外壳: *
供应商设备封装: *
包装: *
输入数目和类型: 1 个单端,单极;1 个差分,单极
MAX1124
100Ω characteristic impedance from the ADC to the
LVDS load device.
Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the end points of the transfer function, once
offset and gain errors have been nullified. However, the
static linearity parameters for the MAX1124 are mea-
sured using the histogram method with an input fre-
quency of 10MHz.
Differential Nonlinearly (DNL)
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes and a monotonic transfer function. The
MAX1124’s DNL specification is measured with the his-
togram method based on a 10MHz input tone.
Dynamic Parameter Definitions
Aperture Jitter
Figure 11 depicts the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 11).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
tion error only and results directly from the ADC’s reso-
lution (N bits):
SNRdB[max] = 6.02dB x N + 1.76dB
In reality, other noise sources such as thermal noise,
clock jitter, signal phase noise, and transfer function
nonlinearities are also contributing to the SNR calcula-
tion and should be considered when determining the
SNR in ADC.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS sig-
nal to all spectral components excluding the fundamen-
tal and the DC offset. In case of the MAX1124, SINAD is
computed from a curve fit.
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio of RMS amplitude of the carrier fre-
quency (maximum signal component) to the RMS value
of the next-largest noise or harmonic distortion compo-
nent. SFDR is usually measured in dBc with respect to
the carrier frequency amplitude or in dBFS with respect
to the ADC’s full-scale range.
Two-Tone Intermodulation Distortion (IMD)
The two-tone IMD is the ratio expressed in decibels of
either input tone to the worst 3rd-order (or higher) inter-
modulation products. The individual input tone levels
are at -7dB full scale.
1.8V, 10-Bit, 250Msps Analog-to-Digital Converter
with LVDS Outputs for Wideband Applications
16
______________________________________________________________________________________
HOLD
ANALOG
INPUT
SAMPLED
DATA (T/H)
T/H
tAD
tAJ
TRACK
CLKN
CLKP
Figure 11. Aperture Jitter/Delay Specifications
PART
RESOLUTION
(Bits)
SPEED GRADE
(Msps)
MAX1122
10
170
MAX1123
10
210
MAX1121
8
250
Pin-Compatible Higher Speed/
Lower Resolution Versions
Package Information
For the latest package outline information and land patterns, go
to www.maxim-ic.com/packages.
PACKAGE TYPE
PACKAGE CODE
DOCUMENT NO.
68 QFN-EP
G6800-4
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