参数资料
型号: MC33912BACR2
厂商: Freescale Semiconductor
文件页数: 19/95页
文件大小: 0K
描述: IC SYSTEM BASIS CHIP 32LQFP
标准包装: 2,000
应用: 系统基础芯片
电流 - 电源: 4.5mA
电源电压: 5.5 V ~ 27 V
工作温度: -40°C ~ 125°C
安装类型: 表面贴装
封装/外壳: 32-LQFP
供应商设备封装: 32-LQFP(7x7)
包装: 带卷 (TR)
MC33912G5AC / MC34912G5AC
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 5. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 5.5 V ?? V SUP ? 18 V, -40°C ? T A ? 125°C for the 33912 and -40°C ? T A ? 85°C for the
34912, unless otherwise noted. Typical values noted reflect the approximate parameter mean at T A = 25°C under nominal
conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
LIN PHYSICAL LAYER: DRIVER CHARACTERISTICS FOR FAST SLEW RATE
LIN Fast Slew Rate (Programming mode)
SR FAST
20
V / ? s
LIN PHYSICAL LAYER: CHARACTERISTICS AND WAKE-UP TIMINGS
Propagation Delay and Symmetry (58)
? s
Propagation Delay of Receiver, t REC_PD = MAX (t REC_PDR , t REC_PDF )
Symmetry of Receiver Propagation Delay, t REC_PDF - t REC_PDR
t REC_PD
t REC_SYM
- 2.0
4.2
6.0
2.0
Bus Wake-Up Deglitcher (Sleep and Stop modes)
(59)(63) (60)
t PROPWL
42
70
95
? s
Bus Wake-Up Event Reported
? s
From Sleep Mode (61)
From Stop Mode (62)
t WAKE_SLEEP
t WAKE_STOP
9.0
27
1500
35
TXD Permanent Dominant State Delay
t TXDDOM
0.65
1.0
1.35
s
PULSE WIDTH MODULATION INPUT PIN (PWMIN)
PWMIN pin (63)
f PWMIN
kHz
Max. frequency to drive HS and LS output pins
-
10
-
Notes
57. V SUP from 7.0 to 18 V, bus load R BUS and C BUS 1.0 nF / 1.0 k ? , 6.8 nF / 660 ? , 10 nF / 500 ? . Measurement thresholds: 50% of TXD
signal to LIN signal threshold defined at each parameter. See Figure 6 , page 21 .
58. See Figure 9 , page 22
59. See Figure 10 , page 22 for Sleep and Figure 11 , page 22 for Stop Mode.
60. This parameter is tested on automatic tester but has not been monitoring during operating life test.
61. The measurement is done with 1μF capacitor and 0mA current load on V DD . The value takes into account the delay to charge the
capacitor. The delay is measured between the bus wake-up threshold (V BUSWU ) rising edge of the LIN bus and when V DD reaches 3.0V.
See Figure 10 , page 22 . The delay depends of the load and capacitor on V DD .
62.
63.
In Stop Mode, the delay is measured between the bus wake-up threshold (V BUSWU ) and the falling edge of the IRQ pin. See Figure 11 ,
This parameter is guaranteed by process monitoring but not production tested.
33912
Analog Integrated Circuit Device Data ?
Freescale Semiconductor
19
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